Wire Bonding in Microelectronics: Materials, Processes, Reliability, and Yield - Rilegato

Harman, George

Rilegato

ISBN 10: 0070326193 ISBN 13: 9780070326194

Casa editrice: McGraw-Hill Education, 1997

Riassunto

The wire bonding bible - now revised and expanded! Get the practical know-how you need to design and evaluate wire bonds engineered with the latest - and still-evolving- metallurgies. Extensively revised and updated, the Second Edition of George Harman's classic Wire Bonding inMicroelectronics shows you step-by-step how to exploit new higherm density interconnection techniques and engineer reliable gonds at a very high yield. You get the hands-on guidance you need to test wire bonds...clean bond pads to improve bondability and realiability...solve cratering, heel cracks, bond fatigue, so-called purple plague and other mechanical problems....bond wires to multichipmodules...and much, much more. You also get up-to-the-minute details on utilizing fine pitch SMT, applying new bonding metallurgies, and exploring wire sweep and the wire bonding mechanism.

Su questo libro

L'autore:

McGraw-Hill authors represent the leading experts in their fields and are dedicated to improving the lives, careers, and interests of readers worldwide

Dalla quarta di copertina:

The classic reference on wire bonding--expanded and updated! Wire Bonding in Microelectronics Second Edition the definitive single-volume reference on wire bonding just got better--in an extensively updated edition with over 100 new pages on new materials, new interconnect techniques such as fine pitch wire bonding, and evaluating the pros and cons of alternative bonding technologies. Wire bonds are used to interconnect integrated circuits, multichip modules and hybrids, and microwave as well as power devices to their packages. The book explains it all, with special emphasis on fine pitch bonding, bonding to MCMs, and additional areas that have been developed since the first edition was published. Readers will learn to: Understand the bonding technology; Test wire bonds; Make reliable bonds at a very high yield; Bond wires to multichip modules; Solve common bonding problems; Evaluate alternative bonding technologies; Improve bondability and reliability via more effective cleaning techniques.

Su questa edizione

• Editore: McGraw-Hill Education
• Data di pubblicazione: 1997
• ISBN 10: 0070326193
• ISBN 13: 9780070326194
• Rilegatura: Copertina rigida
• Numero edizione: 2
• Numero di pagine: 290