Small Fatigue Cracks: Mechanics, Mechanisms, and Applications : Proceedings of the Third Engineering Foundation International Conference, Turtle Bay Hilton, Oahu, Hawaii - Rilegato

Engineering Foundation (U. S.) International Conference 1998 Oahu, Haw

Rilegato

ISBN 10: 0080430112 ISBN 13: 9780080430119

Casa editrice: Elsevier Science Ltd, 1999

Riassunto

This book contains the fully peer-reviewed papers presented at the Third Engineering Foundation Conference on Small Fatigue Cracks, held under the chairmanship of K.S. Ravichandran and Y. Murakami during December 6-11, 1998, at the Turtle Bay Hilton, Oahu, Hawaii. This book presents a state-of-the-art description of the mechanics, mechanisms and applications of small fatigue cracks by most of the world's leading experts in this field. Topics ranging from the mechanisms of crack initiation, small crack behavior in metallic, intermetallic, ceramic and composite materials, experimental measurement, mechanistic and theoretical models, to the role of small cracks in fretting fatigue and the application of small crack results to the aging aircraft and high-cycle fatigue problems, are covered.

Dettagli dell?edizione

• Editore: Elsevier Science Ltd
• Data di pubblicazione: 1999
• Lingua: Inglese
• ISBN 10: 0080430112
• ISBN 13: 9780080430119
• Rilegatura: Copertina rigida
• Numero edizione: 1
• Numero di pagine: 498
• Redattore: Ritchie R. O., Murakami Y.
• Contatto del produttore: non disponibile