Scanning tunneling microscopy (STM), invented by Binnig and Rohrer in 1982, enables one to obtain images reflecting surface electronic structure with atomic resolution. As an offshoot of this technology, Binnig, Quate and Gerber in 1986 invented atomic force microscopy (AFM), also capable of achieving atomic resolution. By now this technology proved to be an indispensable characterization tool with applications to surface physics and chemistry, material science, bio-science and data storage media, with promise in such areas as the semiconductor industry and optical quality control, for example. This book is the first attempt at organizing the whole rainbow of rapidly developing topics dealing with the mapping of a variety of forces across surfaces. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book a valuable source of up-to-date information.
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Dror Sarid is at University of Arizona-Tucson.Review:
From reviews of the first edition: "Quite instructive as to the capabilities and limitations of the SFM, and should ignite the enthusiasm of those unconverted to high resolution microscopy." --Journal of Colloid and Interface Science
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Descrizione libro Oxford University Press, 1991. Hardcover. Condizione libro: New. book. Codice libro della libreria 195062701