Articoli correlati a Scanning Force Microscopy: With Applications to Electric,...
This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.
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Recensione:
From reviews of the first edition: `instructive as to the capabilities and limitations of the STM, and should ignite the enthusiasm of those uncoverted to high resolution microscopy.'Journal of Colloid and Interface Science L`A valuable contribution to the literature, providing a sound theoretical basis.'Journal of Solid State Chemistry
Contenuti:
- Part One: Levers and Noise
- 1: Mechanical properties of levers
- 2: Resonance enhancement
- 3: Sources of noise
- Part Two: Scanning Force Microscopes
- 4: Tunneling detection systems
- 5: Capacitance detection systems
- 6: Homodyne detection systems
- 7: Heterodyne detection systems
- 8: Laser-Diode feedback detection systems
- 9: Polarization detection systems
- 10: Deflection detection systems
- Part Three: Scanning Force Microscopy
- 11: Electric force microscopy
- 12: Magnetic force microscopy
- 13: Atomic force microscopy
- References
- Index
Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.
- EditoreOUP USA
- Data di pubblicazione1994
- ISBN 10 019509204X
- ISBN 13 9780195092042
- RilegaturaCopertina rigida
- Numero di pagine282
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Scanning Force Microscopy: With Applications to Electric; Magnetic; and Atomic Forces
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SCANNING FORCE MICROSCOPY: WITH
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Descrizione libro Hardcover. Condizione: new. Hardcover. Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning ForceMicroscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation,and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field. This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation and applications are discussed. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. Codice articolo 9780195092042
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences)
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences)
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ISBN 13: 9780195092042
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences)
Editore:
Oxford University Press
(1994)
ISBN 10: 019509204X
ISBN 13: 9780195092042
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Scanning Force Microscopy (Hardcover)
Editore:
Oxford University Press Inc, New York
(1994)
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ISBN 13: 9780195092042
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Descrizione libro Hardcover. Condizione: new. Hardcover. Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning ForceMicroscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation,and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field. This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation and applications are discussed. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Codice articolo 9780195092042
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