Digital Integrated Circuit Design - Rilegato

Martin, Ken

Rilegato

ISBN 10: 0195125843 ISBN 13: 9780195125849

Casa editrice: OUP USA, 1999

Riassunto

Working from the fundamentals of transistor-level design and building up to system-level considerations, Digital Integrated Circuit Design shows students with minimal background in electronics how to design state-of-the-art high performance digital integrated circuits. Ideal as an upper-level undergraduate text, it can also be used in first-year graduate courses and as a reference for practicing engineers.

Digital Integrated Circuit Design:
* Presents transistor-level details first, building up to system considerations
* Emphasizes CMOS technology but also includes in-depth explanations of designing in bipolar, BiCMOS, and GaAs technologies
* Features modern, well-designed examples and problems
* Covers important system-level considerations such as timing, pipelining, clock distribution, and system building blocks in detail
* Discusses key elements of semiconductor physics, integrated circuit processing, transistor-level design, logic-level design, system-level design, testing, and more
* Provides physical and intuitive explanations throughout
* Emphasizes conceptual thinking and design methodology over detailed circuit analysis techniques

Su questo libro

Contenuti:

• Preface
• 1. THE BASICS
• 1.1: Simple NMOS Logic Gates
• 1.2: Simple CMOS Logic Gates
• 1.3: Computer Simulation
• 1.4: Transfer Curves and Noise Margins
• 1.5: Gate Delays and Rise and Fall Times
• 1.6: Transient Response
• 1.7: An RC Approximation to the Transient Response of a CMOS Inverter
• 1.8: Summary
• 1.9: Bibliography
• 1.10: Problems
• 2. PROCESSING, LAYOUT, AND RELATED ISSUES
• 2.1: CMOS Processing
• 2.2: Bipolar Processing
• 2.3: CMOS Layout and Design Rules
• 2.4: Advanced CMOS Processing
• 2.5: Bibliography
• 2.6: Problems
• 3. INTEGRATED-CIRCUIT DEVICES AND MODELING
• 3.1: Simplified Transistor Modeling
• 3.2: Semiconductors and pn Junctions
• 3.3: MOS Transistors
• 3.4: Advanced MOS Modeling
• 3.5: Bipolar-Junction Transistors
• 3.6: SPICE-Modeling Parameters
• 3.7: Appendix
• 3.8: SPICE Simulations
• 4. TRADITIONAL MOS DESIGN
• 4.1: Pseudo-NMOS Logic
• 4.2: Pseudo-NMOS Logic Gates
• 4.3: Transistor Equivalency
• 4.4: CMOS Logic
• 4.5: CMOS Gate Design
• 4.6: SPICE Simulations
• 4.7: Bibliography
• 4.8: Problems
• 5. TRANSMISSION-GATE AND FULLY DIFFERENTIAL CMOS LOGIC
• 5.1: Transmission-Gate Logic Design
• 5.2: Differential CMOS Circuits
• 5.3: Bibliography
• 5.4: Problems
• 6. CMOS TIMING AND I/O CONSIDERATIONS
• 6.1: Delay of MOS Circuits
• 6.2: Input/Output Circuits
• 6.3: Bibliography
• 6.4: Problems
• 7. LATCHES, FLIP-FLOPS, AND SYNCHRONOUS SYSTEM DESIGN
• 7.1: CMOS Clocked Latches
• 7.2: Flip-flops
• 7.3: CMOS Flip-flops
• 7.4: Synchronous System Design Techniques
• 7.5: Synchronous System Examples
• 7.6: Bibliography
• 7.7: Problems
• 8. BIPOLAR AND BiCMOS LOGIC GATES
• 8.1: Emitted-Coupled Logic Gates
• 8.2: Current-Mode Logic
• 8.3: BiCMOS
• 8.4: SPICE Simulations
• 8.5: Bibliography
• 8.6: Problems
• 9. ADVANCED CMOS LOGIC DESIGN
• 9.1: Pseudo-NMOS and Dynamic Precharging
• 9.2: Domino-CMOS Logic
• 9.3: No-Race-Logic
• 9.4: Single-Phase Dynamic Logic
• 9.5: Differential CMOS
• 9.6: Dynamic Differential Logic
• 9.7: Bibliography
• 9.8: Problems
• 10. DIGITAL INTEGRATED SYSTEM BUILDING BLOCKS
• 10.1: Multiplexors and Decoders
• 10.2: Barrel Shifters
• 10.3: Counters
• 10.4: Digital Adders
• 10.5: Digital Multipliers
• 10.6: Programmable Logic Arrays
• 10.7: Bibliography
• 10.8: Problems
• 11. INTEGRATED MEMORIES
• 11.1: Static Random-Access Memories
• 11.2: Static Random-Access Memory Storage Cells
• 11.3: Address Buffers and Decoders
• 11.4: Dynamic Bus Precharge and Address-Transition-Detect Circuits
• 11.5: Modifications for Large Static Random-Access Memories
• 11.6: Dynamic Random-Access Memories
• 11.7: Read-Only Memories
• 11.8: Bibliography
• 11.9: Problems
• 12. GaAs DIGITAL CIRCUITS
• 12.1: Introduction
• 12.2: GaAs Processing and Components
• 12.3: MESFET Modeling
• 12.4: MESFET Second-Order Effects
• 12.5: Logic Design with MESFETs
• 12.6: Capacitively Enhanced Logic
• 12.7: GaAs Logic Family Comparison
• 12.8: Heterojunction Bipolar Technology
• 12.9: Bibliography
• 12.10: Problems
• 13. DIGITAL SYSTEM TESTING
• 13.1: Conservative Design Principles
• 13.2: Scan-Design Techniques
• 13.3: Localized Test-Vector Generation and Test-Output Compression Techniques
• 13.4: Boundary-Scan Testing
• 13.5: Bibliography
• 13.6: Problems

Su questa edizione

• Editore: OUP USA
• Data di pubblicazione: 1999
• ISBN 10: 0195125843
• ISBN 13: 9780195125849
• Rilegatura: Copertina rigida
• Numero di pagine: 560