Advanced Scanning Electron Microscopy and X-Ray Microanalysis - Rilegato

Echlin, Patrick; Fiori, C.E.; Goldstein, Joseph; Joy, David C.; Newbury, Dale E.

Rilegato

ISBN 10: 0306421402 ISBN 13: 9780306421402

Casa editrice: Plenum Publishing Co.,N.Y., 1986

Riassunto

This book has its origins in the intensive short courses on scanning elec­ tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con­ tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro­ ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan­ ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol­ ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol­ ume, including those on magnetic contrast and electron channeling con­ trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel­ opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.

Su questo libro

Contenuti

1. Modeling Electron Beam-Specimen Interactions.- 2. SEM Microcharacterization of Semiconductors.- 3. Electron Channeling Contrast in the SEM.- 4. Magnetic Contrast in the SEM.- 5. Computer-Aided Imaging and Interpretation.- 6. Alternative Microanalytical Techniques.- 7. Specimen Coating.- 8. Advances in Specimen Preparation for Biological SEM.- 9. Cryomicroscopy.- References.

Dettagli dell'edizione

• Editore: Plenum Publishing Co.,N.Y.
• Data di pubblicazione: 1986
• Lingua: Inglese
• ISBN 10: 0306421402
• ISBN 13: 9780306421402
• Rilegatura: Copertina rigida
• Numero di pagine: 466
• Contatto del produttore: Springer-Verlag GmbH; customerservice@springernature.com; ; Tiergartenstraße 17; Heidelberg; Baden-Württemberg; 69121; Germania