Electron Microdiffraction - Rilegato

Spence, J. C. H.; Zuo, J. M.

 
9780306442629: Electron Microdiffraction

Sinossi

Much of this book was written during a sabbatical visit by J. Of these, perhaps the most important stimulus to our work on convergent-beam electron diffraction resulted from a visit to the National Science Foundation's Electron Microscopy Facility at Arizona State University by Professor R.

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Contenuti

A Brief History of Electron Microdiffraction. The Geometry of CBED Patterns. Theory. The Measurement of LowOrder Structure Factors and Thickness. Applications of Three and ManyBeam Theory. Large Angle Methods. Symmetry and Lattice Determination. Coherent Nanoprobes STEM. Instrumentation and Experimental Techniques. Index.

Product Description

Book by Zuo JM Spence JCH

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9781489923554: Electron Microdiffraction

Edizione in evidenza

ISBN 10:  1489923551 ISBN 13:  9781489923554
Casa editrice: Springer, 2013
Brossura