Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition - Rilegato

Newbury, Dale E.; Kchlin, Patrick; Joy, David C.; Lyman, Charles E.; Lifshin, Eric; Sawyer, Linda; Michael, Joseph R.

Rilegato

ISBN 10: 0306472929 ISBN 13: 9780306472923

Casa editrice: Plenum Pub Corp, 2007

Riassunto

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

Su questo libro

Recensione:

"There is no other single volume that covers as much theory and practice of SEM or X-ray microanalysis as Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition does. It is clearly written [and] well organized[.]... This is a reference text that no SEM or EPMA laboratory should be without." --Thomas J. Wilson, in Scanning, Vol. 27, No. 4, July/August 2005

"As the authors pointed out, the number of equations in the book is kept to a minimum, and important conceptions are also explained in a qualitative manner. An enhancement CD gives useful database and more detailed discussions on some equations. A lot of very distinct images and schematic drawings make for a very interesting book and help readers who study scanning electron microscopy and X-ray microanalysis. The principal application and sample preparation given in this book are suitable for undergraduate students and technicians learning SEEM and EDS/WDS analyses. It is an excellent textbook for graduate students, and an outstanding reference for engineers, physical, and biological scientists." --Microscopy and Microanalysis, 9:5 (October 2003)

L'autore:

This text is written by a team of authors associated with SEM and X-ray Microanalysis Courses presented as part of the Lehigh University Microscopy Summer School. Several of the authors have participated in this activity for more than 30 years.

Su questa edizione

• Editore: Plenum Pub Corp
• Data di pubblicazione: 2007
• ISBN 10: 0306472929
• ISBN 13: 9780306472923
• Rilegatura: Copertina rigida
• Numero di pagine: 689
• Redattore: Goldstein Joseph I.