Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, January 1 to March 30, 1972 (Classic Reprint) - Rilegato

Bullis, W. Murray

Rilegato

ISBN 10: 0365302058 ISBN 13: 9780365302056

Casa editrice: Forgotten Books, 2019

Riassunto

Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, January 1 to March 30, 1972

The work of the Program is divided into a number of tasks, each directed toward the study of a particular material or device property or measurement technique. This report is subdivided according to these tasks. Highlights of activity during the quarter are given in section 2. Section 3 deals with tasks on methods of measurement for materials; section 4, with those on methods of measurement for process control.

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Dettagli dell?edizione

• Editore: Forgotten Books
• Data di pubblicazione: 2019
• Lingua: Inglese
• ISBN 10: 0365302058
• ISBN 13: 9780365302056
• Rilegatura: Copertina rigida
• Numero di pagine: 64
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