Characterization, Testing, Measurement, and Metrology - Brossura

 
9780367554941: Characterization, Testing, Measurement, and Metrology

Sinossi

This book presents the broad aspects of measurement, performanceanalysis, and characterization for materials and devices through advanced manufacturing processes. The field of measurement and metrology as a precondition for maintaining high-quality products, devices, and systems in materials and advanced manufacturing process applications has grown substantially in recent years.

The focus of this book is to present smart materials in numerous technological sectors such as automotive, bio-manufacturing, chemical, electronics, energy, and construction. Advanced materials have novel properties and therefore must be fully characterized and studied in-depth so they can be incorporated into products that will outperform existing products and resolve current problems.

The book captures the emerging areas of materials science and advanced manufacturing engineering and presents recent trends in research for researchers, field engineers, and academic professionals.

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Informazioni sull?autore

Chander Prakash, Sunpreet Singh, J. Paulo Davim

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Altre edizioni note dello stesso titolo

9780367275150: Characterization, Testing, Measurement, and Metrology

Edizione in evidenza

ISBN 10:  0367275155 ISBN 13:  9780367275150
Casa editrice: CRC Press, 2020
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