Transmission Electron Microscopy: A Textbook for Materials Science

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9780387765020: Transmission Electron Microscopy: A Textbook for Materials Science

This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.

Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.

Recensione:

From the reviews of the second edition:

“This book is intended to be used as a textbook for material science students studying the theory, operation, and application of the TEM. It is truly a book so thoughtfully written that … it will provide a solid foundation for those studying material science. It is richly illustrated with full-color figures and illustrations throughout the text. … There are an abundant number of references at the end of each chapter for further study … . This is an outstanding book … .” (IEEE Electrical Insulation Magazine, Vol. 26 (4), July/August, 2010)

“D.B. Williams and C.B. Carter have now prepared a new edition, splendidly produced by Springer with colour throughout. … This textbook is magnificent, written in a very readable style, immensely knowledgeable, drawing attention to difficulties and occasionally to unsolved problems. Any microscopist who has mastered … the book relevant to his projects will be well armed for battle. … Buy this book!” (P. W. Hawkes, Ultramicroscopy, Vol. 110, 2010)

Dalla quarta di copertina:

This groundbreaking text has been established as the market leader throughout the world. Now profusely illustrated with full color figures and diagrams throughout the text, Transmission Electron Microscopy: A Textbook for Materials Science, Second Edition, provides the necessary insight and guidance for successful hands-on application of this versatile and powerful materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 for self-assessment and over 400 that are suitable for homework assignment.

Key Features:

  • Undisputed market leader, now completely revised and updated
  • Ideal for use as a teaching text at the advanced undergraduate and graduate levels and as a hands-on reference for materials scientists
  • Explains why a particular technique should be used and how a specific concept can be put into practice
  • Nearly 700 figures and diagrams, most in full color

Praise for the first edition:

`The best textbook for this audience available.' – American Scientist

"...highly readable, and an extremely valuable text for all users of the TEM at every level. Treat yourself to a copy!" – Microscopy and Microanalysis

`This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' – Micron

`The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' – MRS Bulletin

`The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' – from the Foreword by Professor Gareth Thomas, University of California, Berkeley

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David B. Williams, C. Barry Carter
Editore: Springer-Verlag New York Inc., New York, NY
ISBN 10: 0387765026 ISBN 13: 9780387765020
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Descrizione libro Springer-Verlag New York Inc., New York, NY. paperback. Condizione libro: New. Codice libro della libreria 9780387765020

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Descrizione libro Springer-Verlag New York Inc., 2008. PAP. Condizione libro: New. New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Codice libro della libreria GB-9780387765020

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Descrizione libro Springer, 2009. Condizione libro: New. book. Codice libro della libreria ria9780387765020_rkm

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Descrizione libro Condizione libro: New. Brand New. US Edition Book. We do not ship to Military Addresses. Fast Shipping with Order Tracking. For Standard Shipping 7-8 business days & Expedite Shipping 4-6 business days, after shipping. Codice libro della libreria 0387765026-RMX

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Descrizione libro Condizione libro: New. Depending on your location, this item may ship from the US or UK. Codice libro della libreria 97803877650200000000

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David B. Williams, C. Barry Carter
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Descrizione libro Springer-Verlag New York Inc., United States, 2009. Paperback. Condizione libro: New. 2nd ed. 2009. 279 x 211 mm. Language: English . Brand New Book. This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment. Codice libro della libreria AAZ9780387765020

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David B. Williams, C. Barry Carter
Editore: Springer-Verlag New York Inc., United States (2009)
ISBN 10: 0387765026 ISBN 13: 9780387765020
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Descrizione libro Springer-Verlag New York Inc., United States, 2009. Paperback. Condizione libro: New. 2nd ed. 2009. 279 x 211 mm. Language: English . Brand New Book. This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment. Codice libro della libreria AAZ9780387765020

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Williams, David B. / Carter, C. Barry
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Descrizione libro Condizione libro: New. Publisher/Verlag: Springer, Berlin | Basics; Diffraction; Imaging; Spectrometry | This market-leading text has been fully updated and expanded in the first new edition for 12 years. Now with four-color illustrations and hundreds of new self-assessment questions, the text is a one-stop shop on this materials characterization technique. | This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment. | Basics.- The Transmission Electron Microscope.- Scattering and Diffraction.- Elastic Scattering.- Inelastic Scattering and Beam Damage.- Electron Sources.- Lenses, Apertures, and Resolution.- How to 'See' Electrons.- Pumps and Holders.- The Instrument.- Specimen Preparation.- Diffraction.- Diffraction in TEM.- Thinking in Reciprocal Space.- Diffracted Beams.- Bloch Waves.- Dispersion Surfaces.- Diffraction from Crystals.- Diffraction from Small Volumes.- Obtaining and Indexing Parallel-Beam Diffraction Patterns.- Kikuchi Diffraction.- Obtaining CBED Patterns.- Using Convergent-Beam Techniques.- Imaging.- Amplitude Contrast.- Phase-Contrast Images.- Thickness and Bending Effects.- Planar Defects.- Imaging Strain Fields.- Weak-Beam Dark-Field Microscopy.- High-Resolution TEM.- Other Imaging Techniques.- Image Simulation.- Processing and Quantifying Images.- Spectrometry.- X-ray Spectrometry.- X-ray Spectra and Images.- Qualitative X-ray Analysis and Imaging.- Quantitative X-ray Analysis.- Spatial Resolution and Minimum Detection.- Electron Energy-Loss Spectrometers and Filters.- Low-Loss and No-Loss Spectra and Images.- High Energy-Loss Spectra and Images.- Fine Structure and Finer Details. | Format: Paperback | Language/Sprache: english | 3005 gr | 281x216x62 mm | 775 pp. Codice libro della libreria K9780387765020

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David B. Williams
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Descrizione libro Springer-Verlag New York Inc. Jul 2008, 2008. Taschenbuch. Condizione libro: Neu. 277x211x43 mm. Neuware - This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment. 775 pp. Englisch. Codice libro della libreria 9780387765020

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DAVID B. WILLIAMS
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Descrizione libro Springer, 2009. Paperback. Condizione libro: NEW. 9780387765020 This listing is a new book, a title currently in-print which we order directly and immediately from the publisher. Codice libro della libreria HTANDREE0273924

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