Failure Mechanisms in Semiconductor Devices

Valutazione media 0
( su 0 valutazioni fornite da Goodreads )
9780471914341: Failure Mechanisms in Semiconductor Devices

Thoroughly surveys the physics of failure mechanisms in semiconductor devices, from the semiconductor dye itself to the packaging and interconnections. Its specific intention is to identify the processes leading to damage and the techniques used to repair or detect it. Discusses and critiques accelerated lifetesting and how the various tests apply to different failure mechanisms. Also provides a critical review of reliability modelling and estimation and techniques, and quality assurance and screening techniques, emphasizing the complexity of present-generation integrated circuits. Throughout, suggestions are offered on ways to improve the quality of devices.

Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.

From the Back Cover:

Failure Mechanisms in Semiconductor Devices Second Edition E. Ajith Amerasekera Texas Instruments Inc., Dallas, USA Farid N. Najm University of Illinois at Urbana-Champaign, USA Since the successful first edition of Failure Mechanisms in Semiconductor Devices, semiconductor technology has become increasingly important. The high complexity of today's integrated circuits has engendered a demand for greater component reliability. Reflecting the need for guaranteed performance in consumer applications, this thoroughly updated edition includes more detailed material on reliability modelling and prediction. The book analyses the main failure mechanisms in terms of cause, effects and prevention and explains the mathematics behind reliability analysis. The authors detail methodologies for the identification of failures and describe the approaches for building reliability into semiconductor devices. Their thorough yet accessible text covers the physics of failure mechanisms from the semiconductor die itself to the packaging and interconnections. Incorporating recent advances, this comprehensive survey of semiconductor reliability will be an asset to both engineers and graduate students in the field.

Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.

I migliori risultati di ricerca su AbeBooks


Amerasekera, E. Ajith; Campbell, D. S.
Editore: Wiley
ISBN 10: 0471914347 ISBN 13: 9780471914341
Nuovi Rilegato Quantità: 1
Cloud 9 Books
(Wellington, FL, U.S.A.)
Valutazione libreria

Descrizione libro Wiley. Hardcover. Condizione libro: New. 0471914347 New Condition. Codice libro della libreria NEW7.1949755

Maggiori informazioni su questa libreria | Fare una domanda alla libreria

Compra nuovo
EUR 69,40
Convertire valuta

Aggiungere al carrello

Spese di spedizione: EUR 4,20
In U.S.A.
Destinazione, tempi e costi