Failure Mechanisms in Semiconductor Devices - Rilegato

Amerasekera, E. Ajith; Campbell, D. S.

Rilegato

ISBN 10: 0471914347 ISBN 13: 9780471914341

Casa editrice: John Wiley & Sons Inc, 1987

Riassunto

Thoroughly surveys the physics of failure mechanisms in semiconductor devices, from the semiconductor dye itself to the packaging and interconnections. Its specific intention is to identify the processes leading to damage and the techniques used to repair or detect it. Discusses and critiques accelerated lifetesting and how the various tests apply to different failure mechanisms. Also provides a critical review of reliability modelling and estimation and techniques, and quality assurance and screening techniques, emphasizing the complexity of present-generation integrated circuits. Throughout, suggestions are offered on ways to improve the quality of devices.

Su questo libro

Product Description:

Book by Amerasekera E Ajith Campbell D S

Su questa edizione

• Editore: John Wiley & Sons Inc
• Data di pubblicazione: 1987
• ISBN 10: 0471914347
• ISBN 13: 9780471914341
• Rilegatura: Copertina rigida
• Numero di pagine: 220