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E. Ajith Amerasekera is the author of Failure Mechanisms in Semiconductor Devices, 2nd Edition, published by Wiley. Farid N. Najm is the author of Failure Mechanisms in Semiconductor Devices, 2nd Edition, published by Wiley.
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Spese di spedizione:
EUR 11,99
Da: Germania a: Italia
Descrizione libro Gebunden. Condizione: New. Failure Mechanisms in Semiconductor Devices Second Edition E. Ajith Amerasekera Texas Instruments Inc., Dallas, USA Farid N. Najm University of Illinois at Urbana-Champaign, USA Since the successful first edition of Failure Mechanisms in Semiconductor Devic. Codice articolo 446918635
Descrizione libro HRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000. Codice articolo FW-9780471954828
Descrizione libro Condizione: New. Codice articolo 34912-n
Descrizione libro Condizione: new. Codice articolo a3fd0aac3ccfa8a585c553b128d72818
Descrizione libro Condizione: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Codice articolo ria9780471954828_lsuk
Descrizione libro Condizione: New. Codice articolo 34912-n
Descrizione libro Condizione: New. In this second edition, the authors identify the sources of failure mechanism in semiconductor devices, examine possible detection and elimination techniques, and determine the effectiveness of reliability devices. The references have been updated and recent advances are discussed. Num Pages: 358 pages, Illustrations. BIC Classification: PHFC; TGMT; TGPR; TJFD5. Category: (P) Professional & Vocational. Dimension: 239 x 165 x 25. Weight in Grams: 676. . 1997. 2nd Edition. Hardcover. . . . . Codice articolo V9780471954828
Descrizione libro Hardcover. Condizione: new. Hardcover. Failure Mechanisms in Semiconductor Devices Second Edition E. Ajith Amerasekera Texas Instruments Inc., Dallas, USA Farid N. Najm University of Illinois at Urbana-Champaign, USA Since the successful first edition of Failure Mechanisms in Semiconductor Devices, semiconductor technology has become increasingly important. The high complexity of today's integrated circuits has engendered a demand for greater component reliability. Reflecting the need for guaranteed performance in consumer applications, this thoroughly updated edition includes more detailed material on reliability modelling and prediction. The book analyses the main failure mechanisms in terms of cause, effects and prevention and explains the mathematics behind reliability analysis. The authors detail methodologies for the identification of failures and describe the approaches for building reliability into semiconductor devices. Their thorough yet accessible text covers the physics of failure mechanisms from the semiconductor die itself to the packaging and interconnections. Incorporating recent advances, this comprehensive survey of semiconductor reliability will be an asset to both engineers and graduate students in the field. In this second edition, the authors identify the sources of failure mechanism in semiconductor devices, examine possible detection and elimination techniques, and determine the effectiveness of reliability devices. The references have been updated and recent advances are discussed. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Codice articolo 9780471954828
Descrizione libro Condizione: New. New. In shrink wrap. Looks like an interesting title! 1.45. Codice articolo Q-0471954829
Descrizione libro Hardcover. Condizione: Brand New. 2nd sub edition. 345 pages. 9.50x6.50x1.00 inches. In Stock. Codice articolo __0471954829