Testing of Digital Systems - Rilegato

Jha, N. K.; Gupta, S.

Rilegato

ISBN 10: 0521773563 ISBN 13: 9780521773560

Casa editrice: Cambridge University Press, 2003

Riassunto

The most comprehensive and wide ranging book on the testing of semiconductor devices and systems.

Su questo libro

Informazioni sugli autori

Niraj Jha is Professor of Electrical Engineering at Princeton University and head of the Center of Embedded System-on-a-Chip Design, where his current research is focussed on the synthesis and testing of these devices. He is a fellow of IEEE, associate editor of IEEE Transactions on VLSI Systems and The Journal of Electronic Testing: Theory and Applications (JETTA) and a recipient of the AT&T Foundation award and the NEC preceptorship award for research excellence.

Sandeep Gupta is an Associate Professor in the Department of Electrical Engineering at the University of Southern California, USA. He is Co-Director of the M.S. Program in VLSI Design, with research interests in the area of VLSI testing and design. He is a member of the IEEE.

Dettagli dell'edizione

• Editore: Cambridge University Press
• Data di pubblicazione: 2003
• Lingua: Inglese
• ISBN 10: 0521773563
• ISBN 13: 9780521773560
• Rilegatura: Copertina rigida
• Numero di pagine: 1016
• Contatto del produttore: non disponibile
• Persona responsabile: Avery; https://www.avery.fr/; ; chemin des peupliers 27; Dardilly; Francia