Scanning Tunneling Microscopy/ Spectroscopy and Related Techniques: 12th International Conference, STM'03: v. 696 - Rilegato

Rilegato

ISBN 10: 0735401683 ISBN 13: 9780735401686

Casa editrice: American Institute of Physics, 2003

Riassunto

At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed.

Dettagli dell'edizione

• Editore: American Institute of Physics
• Data di pubblicazione: 2003
• Lingua: Inglese
• ISBN 10: 0735401683
• ISBN 13: 9780735401686
• Rilegatura: Copertina rigida
• Numero di pagine: 197
• Redattore: Koenraad Paul M., Kemerink Martijn
• Contatto del produttore: non disponibile
• Persona responsabile: non disponibile