Yield and Variability Optimization of Integrated Circuits - Rilegato

Styblinski, M. A.; Jian Cheng Zhang

 
9780792395515: Yield and Variability Optimization of Integrated Circuits
Rilegato
ISBN 10: 0792395514 ISBN 13: 9780792395515
Casa editrice: Springer-Verlag GmbH, 1995

Sinossi

This text deals with the primary and theoretical and practical aspects of IC statistical design and covers the important issues of IC statistical design and the relevant mathematical framework. It describes a spectrum of different statistical circuit design problems, such as parametric yield optimization, generalized on-target design, variability minimization, performance tuning, and worst-case design. It also covers such topics as device statistical and worst-case modelling, design of experiments and factor screening, together with some basic tenets of fuzzy set theory and multi-objective statistical optimization. Several practical examples are used to familiarize the reader with the concepts, and demonstrate the applicability of various statistical circuit design methodologies. This book is intended as introductory reference material for various groups of IC designers, and the methodologies described provide an understanding of the complex problems of statistical circuit design, thus helping to enhance the overall quality of the ICs delivered to the customers.

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Contenuti

List of Figures. Preface. 1. Introduction. 2. Overview of IC Statistical Modeling. 3. Design of Experiments. 4. Parametric Yield Maximization. 5. Variability Minimization and Tuning. 6. Worst-Case Measure Reduction. 7. Multi-Objective Circuit Optimization. A: Commonly Used Orthogonal Arrays. B: SPICE3 Input Decks. References. Index.

Product Description

Book by Jian Cheng Zhang Styblinski MA

Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.

Editore
Springer-Verlag GmbH
Data di pubblicazione
1995
Lingua
Inglese
ISBN 10 
0792395514
ISBN 13 
9780792395515
Rilegatura
Copertina rigida
Numero di pagine
260
Contatto del produttore
Springer-Verlag GmbH
customerservice@springernature.com

Tiergartenstraße 17
Heidelberg
Baden-Württemberg
69121
Germania

Altre edizioni note dello stesso titolo

9781461359357: Yield and Variability Optimization of Integrated Circuits

Edizione in evidenza

ISBN 10:  146135935X ISBN 13:  9781461359357
Casa editrice: Springer, 2012
Brossura