Scan Statistics: Methods and Applications - Rilegato

Rilegato

ISBN 10: 0817647481 ISBN 13: 9780817647483

Casa editrice: Birkhauser, 2009

Riassunto

Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.

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Recensione:

From the reviews:

“The area of scan statistics has developed rapidly in recent years. ... provided excellent overviews of the area. ... There are many papers of interest here for the readers of Technometrics. ... This reviewer enjoyed thumbing through the pages of this volume and feels that the editors hope that it will serve as a valuable reference and source for researchers in applied probability and statistics and in many other areas of science and technology is well justified.” (H. N. Nagaraja, Technometrics, Vol. 53 (1), February, 2011)

Contenuti:

Preface Contributors List of Tables List of Figures Joseph Naus: Father of the Scan Statistic \ S. Wallenstein Precedence-Type Test for the Comparison of Treatments with a Control \ N. Balakrishnan and H. K. T. Ng Extreme Value Results for Scan Statistics \ M. V. Boutsikas, M. V. Koutras, and F. S. Milienos Boundary Crossing Probability Computations in the Analysis of Scan Statistics \ H. P. Chan, I-P. Tu, and N. R. Zhang Approximations for Two-Dimensional Variable Window Scan Statistics \ J. Chen and J. Glaz Applications of Spatial Scan Statistics: A Review \ M. A. Costa and M. Kulldorff Extensions of the Scan Statistics for the Detection and Inference of Spatial Clusters \ L. Duczmal, A. R. Duarte, and R. Tavares 1-Dependent Stationary Sequences and Applications to Scan Statistics \ G. Haiman and C. Preda Scan Statistics in Genome-Wide Scan for Complex Trait Loci \ J. Hoh and J. Ott On Probabilities for Complex Switching Rules in Sampling Inspection \ W. Y. W. Lou and J. C. Fu Bayesian Network Scan Statistics for Multivariate Pattern Detection \ D. B. Neill, G. F. Cooper, K. Das, X. Jiang, and J. Schneider ULS Scan Statistic for Hotspot Detection with Continuous Gamma Response \ G. P. Patil, S. W. Joshi, W. L. Myers, and R. E. Koli False Discovery Control for Scan Clustering \ M. Perone-Pacifico and I. Verdinelli Martingale Methods for Patterns and Scan Statistics \ V. Pozdnyakov and J. M. Steele How Can Pattern Statistics Be Useful for DNA Motif Discovery? \ S. Schbath and S. Robin Occurrence of Patterns and Motifs in Random Strings \ V. T. Stefanov Detection of Disease Clustering \ T. Tango Index

Su questa edizione

• Editore: Birkhauser
• Data di pubblicazione: 2009
• ISBN 10: 0817647481
• ISBN 13: 9780817647483
• Rilegatura: Copertina rigida
• Numero di pagine: 394
• Redattore: Glaz Joseph, Pozdnyakov Vladimir, Wallenstein Sylvan