Covers recent advances in the understanding of the film-formation process brought about by new instrumentation technology. Section I focuses on the mechanism of film formation and the uses of methods such as fluorescence spectroscopy, small-angle neutron scattering, and dielectric spectroscopy. Section II looks at measuring film mechanical properties and relating them to the film-formation process. Section III deals with relevant morphology and film structure, and Section IV details the application of novel chemistry and processes to develop unique film structures for coating systems. For materials scientists. Annotation c. by Book News, Inc., Portland, Or.
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Da: Books From California, Simi Valley, CA, U.S.A.
Hardcover. Condizione: Good. Ex-library copy with usual markings. Codice articolo mon0002219874
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Da: Books Unplugged, Amherst, NY, U.S.A.
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