Articoli correlati a Handbook of Sample Preparation for Scanning Electron...
Here is a complete guide to preparing a variety of specimens for the scanning electron microscope and x-ray microanalyzer. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors.
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Recensione:
This handbook should find its way to the reference bookshelf of all imaging laboratories. It should also become required reading for anyone being trained for SEM work, or anyone who might need to have their samples examined by using such techniques. In that way, it will be less likely that deficient results will be published and that the full potential of the SEM be realized. -- Iolo ap Gwynn, Microscopy and Microanalysis (2010)
L'autore:
Patrick Echlin was a lecturer in the Department of Plant Sciences and Director of the Multi-Imaging Centre, School of Biological Science, University of Cambridge until he retired in 1999. He has taught for more than thirty years at the Lehigh University Microscopy School and is the author and co-auther of eight books on scanning electron microscopy and x-ray microanalysis. He is an Honorary Fellow of the Royal Microscopical Society and received the Distinguished Scientist Award in Biological Sciences from the Microscope Society of America in 2001.
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- EditoreSpringer
- Data di pubblicazione2010
- ISBN 10 1441946748
- ISBN 13 9781441946744
- RilegaturaCopertina flessibile
- Numero di pagine344
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Da: Germania a: U.S.A.
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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
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Springer US Nov 2010
(2010)
ISBN 10: 1441946748
ISBN 13: 9781441946744
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Descrizione libro Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images. 344 pp. Englisch. Codice articolo 9781441946744
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Descrizione libro Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Identifies problems that all specimens present in examining their structure and analysis in the SEMDescribes a series of protocols to ensure that a specimen is properly prepared once the particular problems are identifiedGuides the reader t. Codice articolo 4175007
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Descrizione libro Condizione: New. pp. XII + 330. Codice articolo 263067095
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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
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Springer US
(2010)
ISBN 10: 1441946748
ISBN 13: 9781441946744
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Descrizione libro Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images. Codice articolo 9781441946744
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Descrizione libro Paperback. Condizione: Brand New. 342 pages. 9.90x6.90x0.90 inches. In Stock. Codice articolo 1441946748
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