Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures: Volume 592 - Rilegato

Rilegato

ISBN 10: 1558995005 ISBN 13: 9781558995000

Casa editrice: Cambridge University Press, 2000

Riassunto

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This volume was first published in 2000.

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Descrizione del libro

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. The book, first published in 2000, includes detailed theoretical studies of the nature of SiO2 and its interface with silicon, electron paramagnetic resonance for the study of defects, electron tunneling, and band alignment among others.

Dettagli dell?edizione

• Editore: Cambridge University Press
• Data di pubblicazione: 2000
• Lingua: Inglese
• ISBN 10: 1558995005
• ISBN 13: 9781558995000
• Rilegatura: Copertina rigida
• Numero di pagine: 406
• Redattore: Buchanan D. A., Edwards Arthur H., Bardeleben H. J. Von, Hattori T.
• Contatto del produttore: non disponibile