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Descrizione libro HRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000. Codice articolo GZ-9781594545757
Descrizione libro HRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000. Codice articolo GZ-9781594545757
Descrizione libro Condizione: New. Codice articolo 4327708-n
Descrizione libro Condizione: New. Editor(s): Miller, Thomas S. Num Pages: 231 pages, tables & charts. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 262 x 190 x 21. Weight in Grams: 710. . 2006. Hardcover. . . . . Codice articolo V9781594545757
Descrizione libro Condizione: New. Codice articolo 4327708-n
Descrizione libro Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service. Codice articolo ABEOCT23-246302
Descrizione libro Hardcover. Condizione: new. Hardcover. This book includes within its scope studies of the structural, electrical, optical and acoustical properties of bulk, low-dimensional and amorphous semiconductors; computational semiconductor physics; interface properties, including the physics and chemistry of heterojunctions, metal-semiconductor and insulator-semiconductor junctions; all multi-layered structures involving semiconductor components. Dopant incorporation. Growth and preparation of materials, including both epitaxial (e.g. molecular beam and chemical vapour methods) and bulk techniques; in situ monitoring of epitaxial growth processes, also included are appropriate aspects of surface science such as the influence of growth kinetics and chemical processing on layer and device properties. The physics of semiconductor electronic and optoelectronic devices are examined , including theoretical modelling and experimental demonstration; all aspects of the technology of semiconductor device and circuit fabrication.Relevant areas of 'molecular electronics' and semiconductor structures incorporating Langmuir-Blodgett films; resists, lithography and metalisation where they are concerned with the definition of small geometry structure. The structural, electrical and optical characterisation of materials and device structures are also included. The scope encompasses materials and device reliability: reliability evaluation of technologies; failure analysis and advanced analysis techniques such as SEM, E-beam, optical emission microscopy, acoustic microscopy techniques; liquid crystal techniques; noise measurement, reliability prediction and simulation; reliability indicators; failure mechanisms, including charge migration, trapping, oxide breakdown, hot carrier effects, electro-migration, stress migration; package-related failure mechanisms; effects of operational and environmental stresses on reliability. Contains studies of the structural, electrical, optical and acoustical properties of bulk, low-dimensional and amorphous semiconductors; computational semiconductor physics; and interface properties. This book also includes aspects of surface science such as, the influence of growth kinetics and chemical processing on layer and device properties. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Codice articolo 9781594545757
Descrizione libro Condizione: New. Editor(s): Miller, Thomas S. Num Pages: 231 pages, tables & charts. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 262 x 190 x 21. Weight in Grams: 710. . 2006. Hardcover. . . . . Books ship from the US and Ireland. Codice articolo V9781594545757
Descrizione libro Condizione: New. pp. x + 231 Index. Codice articolo 264549996
Descrizione libro Condizione: New. pp. x + 231 Illus. Codice articolo 3330739