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Reliability, Robustness and Failure Mechanisms of Led Devices: Methodology and Evaluation - Rilegato
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The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies. This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.
- Deals exclusively with reliability, based on the physics of failure for infrared LEDs
- Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications
- Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution
- Focuses on the method to extract fundamental parameters from electrical and optical characterizations
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Informazioni sull?autore
Yannick Deshayes is Associate Professor at the University of Bordeaux, France. His research focuses on the physics of failure, from photonics materials to complex devices.
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Reliability, Robustness and Failure Mechanisms of LED Devices
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Elsevier Science & Technology, ISTE Press - Elsevier, 2016
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ISBN 13: 9781785481529
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Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed. Englisch. Codice articolo 9781785481529
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Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation
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Reliability, Robustness and Failure Mechanisms of LED Devices : Methodology and Evaluation
Editore:
Elsevier Science & Technology, ISTE Press - Elsevier, 2016
ISBN 10: 1785481525
ISBN 13: 9781785481529
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Buch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed. Codice articolo 9781785481529
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Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation
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Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation
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