Reliability, Robustness and Failure Mechanisms of Led Devices: Methodology and Evaluation - Rilegato

Deshayes, Yannick; Bechou, Laurent

 
9781785481529: Reliability, Robustness and Failure Mechanisms of Led Devices: Methodology and Evaluation
Rilegato
ISBN 10: 1785481525 ISBN 13: 9781785481529
Casa editrice: Elsevier Science Ltd, 2016

Sinossi

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.

Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.

Informazioni sull?autore

Yannick Deshayes is Associate Professor at the University of Bordeaux, France. His research focuses on the physics of failure, from photonics materials to complex devices.

Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.

Editore
Elsevier Science Ltd
Data di pubblicazione
2016
Lingua
Inglese
ISBN 10 
1785481525
ISBN 13 
9781785481529
Rilegatura
Copertina rigida
Numero edizione
1
Numero di pagine
172
Contatto del produttore
non disponibile
Persona responsabile
non disponibile