X-RAY AND IMAGE ANALYSIS IN ELECTRON MICROSCOPY - Rilegato

John J. Friel; Ralf Terborg; Stefan Langner; Tobias Salge; Martin Rohde; Jana Berlin

Rilegato

ISBN 10: 3000535373 ISBN 13: 9783000535376

Riassunto

This book provides the reader with a discussion of X-ray microanalysis and imaging techniques. It is meant to be an introduction for newcomers to the fields and a reference for experienced microscopists. This third edition has been largely rewritten, reflecting the huge advances in hardware and software technology. Table of contents: I. Introduction II. Electron-specimen interaction and X-ray generation III. X-ray measurement IV. Qualitative analysis V. Quantitative analysis VI. Precision and accuracy VII. Operating conditions in the microscope VIII. Digital imaging: Processing and image math IX. Image and feature analysis X. X-ray maps and line scans XI. Application examples

Su questa edizione

• Data di pubblicazione: 2016
• ISBN 10: 3000535373
• ISBN 13: 9783000535376
• Rilegatura: Hardcover
• Numero di pagine: 118