High-Resolution X-Ray Scattering from Thin Films and Multilayers: High Resolution X-Ray Scattering from Crystalline Thin Films: Vol 149 - Rilegato

Holy, Vaclav; Pietsch, Ullrich; Baumbach, Tilo

Rilegato

ISBN 10: 354062029X ISBN 13: 9783540620297

Casa editrice: Springer Verlag, 1998

Riassunto

This critical overview presents experimental methods for solving most frequent structural problems of mono-crystalline thin films and layered systems, including thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is intended as a reference for experimentalists who want to improve their knowledge on modern X-ray methods for thin film analysis.

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Dalla quarta di copertina

This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems:
thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.

Dettagli dell'edizione

• Editore: Springer Verlag
• Data di pubblicazione: 1998
• Lingua: Inglese
• ISBN 10: 354062029X
• ISBN 13: 9783540620297
• Rilegatura: Copertina rigida
• Numero edizione: 1
• Numero di pagine: 256
• Contatto del produttore: non disponibile
• Persona responsabile: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Germania