Transmission Electron Microscopy and Diffractometry of Materials - Rilegato

Fultz, Brent; Howe, James

 
9783642297601: Transmission Electron Microscopy and Diffractometry of Materials
Rilegato
ISBN 10: 3642297609 ISBN 13: 9783642297601
Casa editrice: Springer Nature, 2012

Sinossi

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.

Informazioni sull?autore

Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on Transmission Electron Microscopy and Diffractometry of Materials.

James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.

Dalla quarta di copertina

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.

Editore
Springer Nature
Data di pubblicazione
2012
Lingua
Inglese
ISBN 10 
3642297609
ISBN 13 
9783642297601
Rilegatura
Copertina rigida
Numero edizione
4
Numero di pagine
761
Contatto del produttore
non disponibile
Persona responsabile
CMN Printpool Inh. Mathis Neumann
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Altre edizioni note dello stesso titolo

9783642433153: Transmission Electron Microscopy and Diffractometry of Materials

Edizione in evidenza

ISBN 10:  3642433154 ISBN 13:  9783642433153
Casa editrice: Springer, 2014
Brossura