VLSI Technology: Fundamentals and Applications: 12 - Brossura

Brossura

ISBN 10: 3642691943 ISBN 13: 9783642691942

Casa editrice: Springer, 2011

Riassunto

The origin of the development of integrated circuits up to VLSI is found in the invention of the transistor, which made it possible to achieve the ac­ tion of a vacuum tube in a semiconducting solid. The structure of the tran­ sistor can be constructed by a manufacturing technique such as the intro­ duction of a small amount of an impurity into a semiconductor and, in ad­ dition, most transistor characteristics can be improved by a reduction of dimensions. These are all important factors in the development. Actually, the microfabrication of the integrated circuit can be used for two purposes, namely to increase the integration density and to obtain an improved perfor­ mance, e. g. a high speed. When one of these two aims is pursued, the result generally satisfies both. We use the Engl ish translation "very large scale integration (VLSIl" for "Cho LSI" in Japanese. In the United States of America, however, similar technology is bei ng developed under the name "very hi gh speed integrated circuits (VHSIl". This also originated from the nature of the integrated circuit which satisfies both purposes. Fortunately, the Japanese word "Cho LSI" has a wider meani ng than VLSI, so it can be used ina broader area. However, VLSI has a larger industrial effect than VHSI.

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Contenuti

1. lntroduction.- 1.1 The Significance of Semiconductor Integrated Circuits.- 1.2 Prospects of High-Density Integration.- 1.3 Device Dimensions and Density of Integration.- 1.4 Outline of the Microfabrication Technology.- 2. Electron Beam Lithography.- 2.1 Background.- 2.1.1 History of the Machine Development.- 2.1.2 Classification of the Machines.- a) Electron-Beam Source.- b) Beam Shape.- c) Beam Scanning.- d) Sample Movement.- e) Samples.- 2.1.3 Factors Determining Pattern Accuracy.- a) Beam Diameter.- b) Aberrations in the Electron-Optics System.- c) Sample Movement, Beam-Position Control and Alignment.- d) Proximity Effect.- 2.1.4 Factors Determining the Drawing Speed.- 2.2 Components for Electron-Beam Lithography.- 2.2.1 Electron-Beam Source.- a) Fundamentals.- b) Lanthanum Hexaboride (LaB6) Cathode Electron Gun.- c) Field-Emission (FE) Electron Gun.- 2.2.2 Electron Optical Column.- a) Electromagnetic Lens.- b) Electrostatic Lens.- c) Demagnifying Electron-Optical Column.- d) Magnifying Electron-Optical Column.- 2.2.3 Electron-Beam Delineation.- a) Delineation of Spatially Separated Figures.- b) Delineation of Figures Over the Surface of a Large Work Piece.- 2.2.4 Alignment.- a) Alignment Mark Structure.- b) Mark Position Deciding Method.- c) Writing Position Compensation Method.- d) Comments.- 2.2.5 Radiation Damage.- 2.3 Software for Electron-Beam Lithography.- 2.3.1 Pattern Data Processing.- a) Input Files.- b) Fundamental Pattern Data Processing Operations.- c) Algorithms.- 2.3.2 Correction of Distortion.- 2.3.3 Correction of the Proximity Effect.- a) Fitting the EID Function.- b) Dosage Calculation and Representative Points.- c) Pattern-Shape Adjustment Techniques.- d) Dot-Beam Correction.- e) Simultaneous Correction Method.- 2.3.4 Warped-Wafer Correction.- a) Algorithm.- b) Cubic Interpolation Method.- 2.4 Wafer and Writing Systems.- 2.4.1 EB System with High Current FE Gun (VL-FI).- a) Electron Gun and the Electron-Optical System.- b) Mechanical System.- c) Electronic Control System.- d) Computer System and Software.- e) Experimental Results.- 2.4.2 Variable-Shaped-Beam Lithography (VL-S2).- a) VL-S2 System Configuration.- b) VL-S2 Electron-Optics System.- c) VL-S2 Stage System.- d) VL-S2 Data Transfer Control System.- e) VL-S2 Software System.- f) VL-S2 Pattern Exposure.- 2.4.3 Raster-Scan-Type Electron-Beam Delineator (VL-Rl, VL-R2).- a) VL-R1 Writing Scheme.- b) VL-R1 System Configuration.- c) VL-R1 Delineation Results.- d) VL-R2 Writing Scheme.- e) VL-R2 System Composition.- f) VL-R2 Delineation Results.- g) Conclusion on VL-R1 and VL-R2.- 3. Pattern Replication Technology.- 3.1 UV Replication Technologies.- 3.1.1 Reduction Stepper (VL-SR 2).- a) Imaging Optics.- b) Alignment Mechanism.- 3.1.2 1:1 Stepper (VL-SR 1).- a) Imaging Optics.- b) Alignment Mechanism.- 3.2 Deep-UV Projection System.- 3.2.1 Light Source.- 3.2.2 Alignment.- 3.2.3 Overall System.- 3.3 X-Ray Lithography.- 3.3.1 Problems of X-Ray Lithography.- a) Features.- b) Geometrical Distortions.- c) Wavelength Selection.- 3.3.2 X-Ray Source.- 3.3.3 X-Ray Masks.- a) Inorganic Materials.- b) Organic Materials.- 3.3.4 Alignment.- 3.3.5 Examples of Experimental Systems.- 3.4 Electron-Beam Projection.- 3.4.1 Demagnifying Electron Projection Method.- a) Design of an Electromagnetic Lens with a Large Pole-Piece Bore Diameter.- b) Alignment Procedures.- c) Self-Supporting Metal Foil Mask.- 3.4.2 Photocathode Pattern Transfer System.- a) Imaging System.- b) Photocathode Mask and Illumination Source.- c) Alignment System.- d) System Description.- 3.5 Radiation-Sensitive Resist for Microfabrication.- 3.5.1 Electron-Beam Resist.- a) Positive-Type Electron-Beam Resist.- b) Negative-Type Electron-Beam Resist.- c) Problems of Electron-Beam Resist.- 3.5.2 X-Ray Resist.- a) Positive-Type X-Ray Resist.- b) Negative-Type X-Ray Resist.- 3.5.3 The Future of Electron-Beam and X-Ray Resists.- 4. Mask Inspection Technology.- 4.1 Principles of Mask Inspection.- 4.1.1 Signal Generation and Processing.- a) Detection of Signal.- b) Transmission of Signal.- c) Miscellanous.- 4.1.2 Mask Pattern Inspection Technology.- a) Beam Width and Dimension Accuracy.- b) Dimension Inspection and Its System.- 4.1.3 Mask Defect Inspection.- a) Defect Decision.- b) List of Mask Defect Inspection Systems.- 4.2 Mask Inspection Systems.- 4.2.1 Mask Pattern Inspection System.- a) Dimension Inspection System Using a Light Beam.- b) Dimension Inspection System by Using an Electron Beam.- 4.2.2 The Mask-Defect Inspection System.- a) Optical Mask-Defect Inspection System.- b) Mask-Defect Inspection by an Electron Beam.- 5. Crystal Technology.- 5.1 Overview.- 5.1.1 Crystal Growth and Machining Process.- 5.1.2 Impurities.- 5.2 Impurities in Si Crystals.- 5.2.1 Outline.- 5.2.2 Fourier Transform Infrared Spectroscopy.- 5.2.3 Photoluminescence Spectroscopy.- 5.2.4 Ion Microanalyzer.- 5.2.5 Striation.- 5.2.6 Oxygen Donor.- 5.3 Wafer Bow and Warpage.- 5.3.1 Definition and Measurement Methods.- 5.3.2 The Slicing Condition.- 5.3.3 Warpage of Silicon Wafers in Heat Processing.- 5.3.4 Effect of Mechanical Damage on Thermal Warpage.- 5.3.5 Oxygen Effects on Wafer Thermal Warpage.- 5.4 Thermally Induced Microdefects.- 5.4.1 The Definition of Thermally Induced Microdefects and Their Detection Technique.- a) Characteristics of Microdefects.- b) Infrared Absorption Spectroscopy.- c) Measurement Techniques Utilizing X-Ray Diffraction.- d) Transmission Electron Microscopy.- e) Etching Method.- f) Photoluminescence Spectroscopy.- 5.4.2 The Role of Oxygen and Carbon for the Formation of Thermally Induced Microdefects.- a) Thermally Induced Microdefects in Wafers Where the Carbon and Oxygen Concentrations Are Controlled.- b) Formation Mechanism of Thermally Induced Microdefects.- c) Suppression of Microdefects Düring LSI Processes.- 5.4.3 Ion Implantation Induced Defects.- 5.4.4 Gettering.- 5.5 Epitaxial Growth.- 5.5.1 Low-Pressure Epitaxial Growth.- 5.5.2 Molecular-Beam Epitaxial Growth.- 6. Process Technology.- 6.1 Dry Etching.- 6.1.1 Dry Etching and Fine Pattern Definition.- 6.1.2 Plasma Etching Equipment.- a) Plasma Etching Equipments and Their Characteristics.- b) Example of the Planar-Type Plasma-Etching Equipment.- 6.1.3 Plasma Etching Technique.- a) Etching Characteristics and Its Accuracy.- b) Etching of Si02.- c) Etching of Si and Poly-Si.- d) Etching of Al.- 6.1.4 Future Prospects.- 6.2 Beam Annealing.- 6.2.1 Laser Annealing in VLSI Technology.- a) Laser Annealing of Ion-Implanted Crystals.- b) Laser Annealing for the Self-Alignment Technology.- c) Crystal Growth by Laser Irradiation.- d) Laser Annealing and Interfacial Reactions.- 6.2.2 Fundamentals of Laser Annealing.- a) Temperature Distribution and Variation.- b) Physical Process Under Laser Irradiation.- 6.2.3 Other Beam Annealing Technologies.- 6.3 Thin-Film Deposition Techniques.- 6.3.1 CVD Technique.- 6.3.2 Evaporation Technique.- 6.4 Metallization.- 6.4.1 Fine Pattern Technology for Metallization.- a) Aluminum Pattern Formation by Parallel-Plate-Reactor-Type Plasma Etching.- b) Pattern Formation by the Lift-Off Technology.- 6.4.2 Refractory Metal Metallization.- 6.5 Evaluation of Gate Oxide Film.- 6.5.1 Corona Charging Method.- 6.5.2 Avalanche Injection Method.- 6.6 Super Clean Environment.- 6.6.1 Cleanness and Its Monitoring.- 6.6.2 Super Clean Environment.- a) Concentration of Dust Particles of Larger Than 0.1 ?m.- b) Dust Generation Rate and Transmission Rate of HEPA Filters.- c) 0.1 ?m-Base Clean Environment.- 7. Fundamentals of Test and Evaluation.- 7.1 Testing and Evaluation of the Device Design.- 7.1.1 Testing of Device-Design Data.- 7.1.2 The Software System for Pattern Check.- 7.2 Device Analysis and Evaluation.- 7.2.1 Methods of Device Analysis and Evaluation.- 7.2.2 Equipment so Far Developed.- a) A System for Precisely Measuring the Temperature in the Infrared.- b) The Electron Micro-Probe Failure Analysis System.- c) A Device Analysis System Based on Laser Scanning.- 7.2.3 Microdevice Analysis and Evaluation.- 7.3 Device Testing.- 7.3.1 Test Methods.- 7.3.2 The VLSI Tester.- 8. Basic Device Technology.- 8.1 Background.- 8.2 Limitations for Miniaturization.- 8.2.1 Physical Limiting Factors Related to Device Characteristics.- a) Weakening of Insulation.- b) Impurity Fluctuation.- c) Electromigration.- d) Heat Generation and Cooling.- e) Drift-Velocity Saturation of Carriers.- f) Impact Ionization.- 8.2.2 Physical Limiting Factors Related to Device Fabrication.- 8.2.3 Examples of Minimum Device Size.- a) Minimum Size of a DSA MOS Transistor.- b) Minimum Size of a Switch Transistor.- 8.3 Prediction of Device Performance Advancements.- 8.3.1 Requirements.- 8.3.2 Forecast of Integration-Density and Speed-Performance Trends.- 8.4 Examples of Device Structure.- 8.4.1 The DSA MOS Transistor.- 8.4.2 Multiple Wall Self-Alignment Technology.- 8.4.3 Quadruply Self-Aligned Stacked High Capacitor RAM.- 8.4.4 Dielectric Isolation.- 8.4.5 I2L.- 8.4.6 SIT (Static Induction Transistor).- 8.4.7 GaAs IC Technology.- 8.4.8 Josephson Junction Devices.- 8.5 Device Structure.- 8.5.1 Logic Circuit.- a) Ultrafast Logic Circuits.- b) High-Density MOS VLSI Logic.- c) The VLSI System.- d) Gigabit Logic Systems.- 8.5.2 Memory Circuits.- a) Static Memories with Weak Inversion, Operating the MOS Transistor as a Load.- b) The CML Compatible High-Speed Static MOS Memory.- c) The DSA MOS High-Speed Static Memory.- d) Dynamic Memories.- References.

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Dettagli dell'edizione

• Editore: Springer
• Data di pubblicazione: 2011
• Lingua: Inglese
• ISBN 10: 3642691943
• ISBN 13: 9783642691942
• Rilegatura: Copertina flessibile
• Numero di pagine: 468
• Redattore: Tarui Yasuo
• Contatto del produttore: non disponibile
• Persona responsabile: Springer Nature Customer Service Center GmbH; ProductSafety@springernature.com; ; Europaplatz 3,69115 Heidelberg, Germany; Heidelberg; 69115; Germania