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Minimization of Dynamic Power Through Structural Changes &Vt Techniques: low power cmos circuits - Brossura
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Over the past decade, low power, energy efficient Very Large Scale Integration design has been the focal point for active research and development. The rapid technology scaling, growing integration capacity and leakage power dissipation are the contributing factors for increas in the complexity of modern VLSI design. Voltage scaling is one of the most efficient ways for reducing power and energy in VLSI circuitry. Due to the reduced threshold voltage, switching speed becomes faster, active leakage current is increased. A technique to dynamically manage active leakage current, which reduces the energy dissipation in VLSI circuitry at different circuits with different levels of complexity is required. As technology scale into the deep sub micron technology regime, sub threshold leakage power increases exponentially with the reduction of the threshold voltage. Therefore effective leakage and dynamic power minimization techniques become necessary. Ground, power and hybrid gated techniques are proposed as effective circuit level techniques that get better performance, low leakage and low dynamic power. The design and performance evaluation of 1-bi.
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- EditoreLAP LAMBERT Academic Publishing
- Data di pubblicazione2020
- ISBN 10 6202672293
- ISBN 13 9786202672290
- RilegaturaCopertina flessibile
- LinguaInglese
- Numero di pagine236
- Contatto del produttorenon disponibile
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Minimization of Dynamic Power Through Structural Changes &Vt Techniques
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LAP LAMBERT Academic Publishing, 2020
ISBN 10: 6202672293
ISBN 13: 9786202672290
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Da: moluna, Greven, Germania
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Kartoniert / Broschiert. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Dayadi LakshmaiahAuthor1: Dr. Dayadi.Lakshmaiah professor of electronics and communication engineering, is presently with Sri Indu Institute of Engineering and Technology, Hyderabad, India. He obtained his Doctoral degree from JNTUK. Codice articolo 387523380
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Minimization of Dynamic Power Through Structural Changes &Vt Techniques
Editore:
LAP LAMBERT Academic Publishing Jun 2020, 2020
ISBN 10: 6202672293
ISBN 13: 9786202672290
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Over the past decade, low power, energy efficient Very Large Scale Integration design has been the focal point for active research and development. The rapid technology scaling, growing integration capacity and leakage power dissipation are the contributing factors for increas in the complexity of modern VLSI design. Voltage scaling is one of the most efficient ways for reducing power and energy in VLSI circuitry. Due to the reduced threshold voltage, switching speed becomes faster, active leakage current is increased. A technique to dynamically manage active leakage current, which reduces the energy dissipation in VLSI circuitry at different circuits with different levels of complexity is required. As technology scale into the deep sub micron technology regime, sub threshold leakage power increases exponentially with the reduction of the threshold voltage. Therefore effective leakage and dynamic power minimization techniques become necessary. Ground, power and hybrid gated techniques are proposed as effective circuit level techniques that get better performance, low leakage and low dynamic power. The design and performance evaluation of 1-bi. 236 pp. Englisch. Codice articolo 9786202672290
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Minimization of Dynamic Power Through Structural Changes &Vt Techniques
Editore:
LAP LAMBERT Academic Publishing Jun 2020, 2020
ISBN 10: 6202672293
ISBN 13: 9786202672290
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
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Taschenbuch. Condizione: Neu. Neuware -Over the past decade, low power, energy efficient Very Large Scale Integration design has been the focal point for active research and development. The rapid technology scaling, growing integration capacity and leakage power dissipation are the contributing factors for increas in the complexity of modern VLSI design. Voltage scaling is one of the most efficient ways for reducing power and energy in VLSI circuitry. Due to the reduced threshold voltage, switching speed becomes faster, active leakage current is increased. A technique to dynamically manage active leakage current, which reduces the energy dissipation in VLSI circuitry at different circuits with different levels of complexity is required. As technology scale into the deep sub micron technology regime, sub threshold leakage power increases exponentially with the reduction of the threshold voltage. Therefore effective leakage and dynamic power minimization techniques become necessary. Ground, power and hybrid gated techniques are proposed as effective circuit level techniques that get better performance, low leakage and low dynamic power. The design and performance evaluation of 1-bi.Books on Demand GmbH, Überseering 33, 22297 Hamburg 236 pp. Englisch. Codice articolo 9786202672290
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Minimization of Dynamic Power Through Structural Changes &Vt Techniques : low power cmos circuits
Editore:
LAP LAMBERT Academic Publishing, 2020
ISBN 10: 6202672293
ISBN 13: 9786202672290
Nuovo
Taschenbuch
Da: AHA-BUCH GmbH, Einbeck, Germania
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Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Over the past decade, low power, energy efficient Very Large Scale Integration design has been the focal point for active research and development. The rapid technology scaling, growing integration capacity and leakage power dissipation are the contributing factors for increas in the complexity of modern VLSI design. Voltage scaling is one of the most efficient ways for reducing power and energy in VLSI circuitry. Due to the reduced threshold voltage, switching speed becomes faster, active leakage current is increased. A technique to dynamically manage active leakage current, which reduces the energy dissipation in VLSI circuitry at different circuits with different levels of complexity is required. As technology scale into the deep sub micron technology regime, sub threshold leakage power increases exponentially with the reduction of the threshold voltage. Therefore effective leakage and dynamic power minimization techniques become necessary. Ground, power and hybrid gated techniques are proposed as effective circuit level techniques that get better performance, low leakage and low dynamic power. The design and performance evaluation of 1-bi. Codice articolo 9786202672290
Quantità: 1 disponibili