Basics of X-Ray Diffraction and its Applications - Rilegato

K. Ramakanth Hebbar

Rilegato

ISBN 10: 8189866079 ISBN 13: 9788189866075

Casa editrice: I K International, 2007

Riassunto

Starting with the history of the discovery of X-rays by Roentgen and the subsequent formalization of diffraction laws by Von Laue, Bragg and others, this title covers the essential fundamentals of crystallography and the theory of X-ray generation and of the interaction of X-rays with matter. X-ray diffraction theory is covered in detail, serving as an excellent background to the following chapters on application procedures such as the laue, the rotating crystal and powder techniques.

Reciprocal lattice theory is introduced with the necessary vector algebra and the relationship between reciprocal lattice and diffraction. The chapters on film techniques are followed by one on the X-ray diffractometer and its applications. Specific applications, such as crystal structure determination, accurate determination of lattice parameters, single crystal studies, studies of crystallographic texture, stress measurement, order-disorder transformation, phase diagram determination are covered in detail. There is a final chapter on the use of X-ray diffraction in chemical analysis. The examples, solved and unsolved, at the end of chapters will help in understanding the concepts underlying them.

The treatment of topics in each chapter is appropriate for undergraduate and graduate courses in X-ray diffraction, not only for metallurgists and materials scientists/engineers, but also for other disciplines requiring the study of X-ray diffraction.

Dettagli dell?edizione

• Editore: I K International
• Data di pubblicazione: 2007
• Lingua: Inglese
• ISBN 10: 8189866079
• ISBN 13: 9788189866075
• Rilegatura: Copertina rigida
• Numero di pagine: 272
• Contatto del produttore: non disponibile
• Persona responsabile: non disponibile