Fundamentals Of Atomic Force Microscopy - Part I: Foundations: 4 - Brossura

Reifenberger, Ronald G

Brossura

ISBN 10: 9814630357 ISBN 13: 9789814630351

Casa editrice: Wspc, 2015

Riassunto

"The overall structure of the book is excellent. It gives a good description of supplementary information needed for the average graduate student to understand the physics of Atomic Force Microscopy." Mrs Bulletin The atomic force microscope (Afm) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an Afm. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an Afm. Useful as a study guide to “Fundamentals of Afm”, an online video course available at https://nanohub.org/courses/Afm1/ Suitable for Graduate/Undergraduate Independent Reading and Research Course in Afm (with the combination of book and online videos)

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Recensione

The overall structure of the book is excellent. It gives a good description of supplementary information needed for the average graduate student to understand the physics of Atomic Force Microscopy. --MRS Bulletin

Dettagli dell'edizione

• Editore: Wspc
• Data di pubblicazione: 2015
• Lingua: Inglese
• ISBN 10: 9814630357
• ISBN 13: 9789814630351
• Rilegatura: Copertina flessibile
• Numero di pagine: 340
• Contatto del produttore: non disponibile
• Persona responsabile: non disponibile