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Dynamic Laser Stimulation

Tuba Kiyan

ISBN 10: 3659338621 / ISBN 13: 9783659338625
Editore: LAP Lambert Academic Publishing
Nuovi Condizione: New Brossura
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Paperback. 196 pages. Dimensions: 8.7in. x 5.9in. x 0.5in.It is assumed that dynamic analysis of ICs will keep on progressing especially due to the increasing clock rates. Operation in higher frequency ranges requires a high-level quality delay testing capability. Dynamic Laser Stimulation techniques allow timing analysis of devices. CMOS devices, like delay chains and scan chains are investigated by DLS techniques. In order to detect very small laser-induced propagation delay variations with high resolution on the delay chains, different experimental setups are built and they are compared considering the acquisition time and signal quality. Moreover, it is demonstrated that the pulsed laser can suppress the laser induced secondary effects in opposition to the continuous wave laser. For the timing analysis of ICs, a new and systematic method is developed, which uses soft fault injection phenomenon on the scan chains. It can identify the most sensitive signal condition to the laser stimulation by using 1064 nm pulsed laser beam. This item ships from multiple locations. Your book may arrive from Roseburg,OR, La Vergne,TN. Codice inventario libreria 9783659338625

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Titolo: Dynamic Laser Stimulation

Casa editrice: LAP Lambert Academic Publishing

Legatura: Paperback

Condizione libro:New

Tipologia articolo: Paperback

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Riassunto:

It is assumed that dynamic analysis of ICs will keep on progressing especially due to the increasing clock rates. Operation in higher frequency ranges requires a high-level quality delay testing capability. Dynamic Laser Stimulation techniques allow timing analysis of devices. CMOS devices, like delay chains and scan chains are investigated by DLS techniques. In order to detect very small laser-induced propagation delay variations with high resolution on the delay chains, different experimental setups are built and they are compared considering the acquisition time and signal quality. Moreover, it is demonstrated that the pulsed laser can suppress the laser induced secondary effects in opposition to the continuous wave laser. For the timing analysis of ICs, a new and systematic method is developed, which uses “soft fault injection” phenomenon on the scan chains. It can identify the most sensitive signal condition to the laser stimulation by using 1064 nm pulsed laser beam.

About the Author:

Dr. Tuba KIYAN received B.Sc. and M.Sc. degrees in Electronics Engineereing from Yildiz Technical University, Istanbul with focus on semiconductor devices. She had her PhD in Berlin University of Technology in 2010. Currently, she is working as a scientist and lecturer in Yildiz Technical University.

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