Foundations of Measurement Volume II: Geometrical, Threshold, and Probabilistic Representations (Dover Books on Mathematics)

Amos Tversky,Patrick Suppes,R. Duncan Luce,David H. Krantz

ISBN 10: 0486453154 / ISBN 13: 9780486453156

Editore: Dover Publications, 2006

Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! Codice articolo S_414354972

Riassunto:

All of the sciences―physical, biological, and social―have a need for quantitative measurement. This influential series, Foundations of Measurement, established the formal foundations for measurement, justifying the assignment of numbers to objects in terms of their structural correspondence.
Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures. Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations, and Volume III examines representation as expressed in axiomatization and invariance.

Informazioni sull?autore:

David H. Krantz is affiliated with Columbia University; R. Duncan Luce with the University of California, Irvine, and Patrick Suppes with Stanford University. Amos Tversky is deceased.

Dati bibliografici

Titolo: Foundations of Measurement Volume II: ...
Casa editrice: Dover Publications
Data di pubblicazione: 2006
Legatura: Paperback
Condizione: Good