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In. Codice articolo ria9781402093647_new
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Informazioni sull?autore:
Winner of the EDAA (European Design Automation Association) Outstanding Monograph Award in the Verification section. Co-authors Bertacco and Markov are existing Springer authors
Titolo: Functional Design Errors in Digital Circuits...
Casa editrice: Springer
Data di pubblicazione: 2008
Legatura: Rilegato
Condizione: New
Da: Buchpark, Trebbin, Germania
Condizione: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar. Codice articolo 4705182/2
Quantità: 1 disponibili
Da: Buchpark, Trebbin, Germania
Condizione: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar. Codice articolo 4705182/12
Quantità: 1 disponibili
Da: moluna, Greven, Germania
Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Coverage of novel techniques to automate IC debugging, a subject rarely covered in other booksComprehensive scope and solutions: from RTL to post-silicon debuggingThe innovative techniques covered in this book are recent and have been featu. Codice articolo 4095882
Quantità: Più di 20 disponibili
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
Condizione: New. Codice articolo ABLIING23Mar2411530145572
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Da: GreatBookPricesUK, Woodford Green, Regno Unito
Condizione: New. Codice articolo 5844292-n
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Da: GreatBookPrices, Columbia, MD, U.S.A.
Condizione: New. Codice articolo 5844292-n
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices. 200 pp. Englisch. Codice articolo 9781402093647
Quantità: 2 disponibili
Da: AHA-BUCH GmbH, Einbeck, Germania
Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices. Codice articolo 9781402093647
Quantità: 2 disponibili
Da: California Books, Miami, FL, U.S.A.
Condizione: New. Codice articolo I-9781402093647
Quantità: Più di 20 disponibili
Da: Mispah books, Redhill, SURRE, Regno Unito
Hardcover. Condizione: Like New. Like New. book. Codice articolo ERICA75814020936406
Quantità: 1 disponibili