Immagini fornite dal libraio
Riassunto: "INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensivecoverage of the process and design variables that determine theease and feasibility of fabrication (or manufacturability) ofcontemporary VLSI systems and circuits. This book progresses fromsemiconductor processing to electrical design to systemarchitecture. The material provides a theoretical background aswell as case studies, examining the entire design for themanufacturing path from circuit to silicon. Each chapter includestutorial and practical applications coverage.
INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implicationsof manufacturability at every level of abstraction, including theeffects of defects on the layout, their mapping to electricalfaults, and the corresponding approaches to detect such faults. Thereader will be introduced to key practical issues normally appliedin industry and usually required by quality, product, and designengineering departments in today′s design practices:
∗ Yield management strategies
∗ Effects of spot defects
∗ Inductive fault analysis and testing
∗ Fault–tolerant architectures and MCM testing strategies.
This book will serve design and product engineers both fromacademia and industry. It can also be used as a reference ortextbook for introductory graduate–level courses on manufacturing."
About the Editors...
Jose Pineda de Gyvez is an associate professor in the Department ofElectrical Engineering, holding a joint faculty appointment withthe Department of Computer Science, at Texas A&M University.Dr. Pineda de Gyvez was associate editor of technology for IEEETransactions on Semiconductor Manufacturing and associate editorfor cellular neural networks for IEEE Transactions on Circuits andSystems: Part 1.
Dhiraj K. Pradhan is currently a visiting professor with theDepartment of Electrical Engineering at Stanford University (onleave from Texas A&M University.) Prior to joining TexasA&M, he served as professor and coordinator of computerengineering at the University of Massachusetts. Dr. Pradhan hascontributed to VLSI CAD and test fault–tolerant computing, computerarchitecture, and parallel processing research with majorpublications in journals and conferences over the last 25 years.
Titolo: Integrated Circuit Manufacturability
Casa editrice: Wiley-Blackwell
Data di pubblicazione: 1998
Condizione libro: New
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