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NCRE true test exam. high-frequency test sites. three in two simulated exam MS Office Advanced Applications (2015 paperless examination only)(Chinese Edition)

QUAN GUO JI SUAN JI DENG JI KAO SHI JIAO CAI BIAN XIE.

ISBN 10: 7564726229 / ISBN 13: 9787564726225
Nuovi Condizione: New Brossura
Da liu xing (JiangSu, JS, Cina)

Libreria AbeBooks dal 7 aprile 2009

Quantità: 3

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Pub Date: 2014-11-01 Pages: 192 Language: Chinese Publisher: University of Electronic Science and Technology Press. National Computer Rank Examination true test exam. high-frequency test sites. three in two simulated exam MS Office Advanced Applications (2015 Paperless Examination of Special) a total of 15 chapters. the main contents include: Exam Guide. public basics. C language overview. operators and expressions. basic statements. select the structure. loop structures. arrays. functions. p. Codice inventario libreria CQ078374

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Titolo: NCRE true test exam. high-frequency test ...

Legatura: paperback

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Pub Date: 2014-11-01 Pages: 192 Language: Chinese Publisher: University of Electronic Science and Technology Press. National Computer Rank Examination true test exam. high-frequency test sites. three in two simulated exam MS Office Advanced Applications (2015 Paperless Examination of Special) a total of 15 chapters. the main contents include: Exam Guide. public basics. C language overview. operators and expressions. basic statements. select the structure. loop structures. arrays. functions. pointers. preprocessor and dynamic storage allocation. structures and unions. files. operating problems of high frequency test sites succinctly. the new real exam questions and resolve. CD book with the main provider of two parts - a multimedia classroom and mock exam system. Multimedia classroom multimedia approach to explain the important and difficult exams. allow candidates to further...

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