Foto dell'editore

Noncontact Atomic Force Microscopy 2

Seizo Morita

0 valutazioni da Goodreads
ISBN 10: 3642014941 / ISBN 13: 9783642014949
Editore: Springer-Verlag Gmbh Sep 2010, 2010
Nuovi Condizione: Neu
Compra nuovo
Prezzo consigliato: 249.00
Prezzo: EUR 234,33 Convertire valuta
Spedizione: EUR 12,01 Da: Germania a: U.S.A. Destinazione, tempi e costi
Aggiungere al carrello

Offerto da

Rhein-Team Lörrach Ivano Narducci e.K.
Lörrach, Germania

5 stelle

Libreria AbeBooks dal 11 gennaio 2012

Riguardo questo articolo

Neuware - Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology. 401 pp. Englisch. Codice inventario libreria 9783642014949

Quantità: 1

Fare una domanda alla libreria

Dati bibliografici

Titolo: Noncontact Atomic Force Microscopy 2

Casa editrice: Springer-Verlag Gmbh Sep 2010

Data di pubblicazione: 2010

Legatura: Buch

Condizione libro: Neu

Descrizione articolo

Riassunto:

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Review:

"This book gives a comprehensive overview of the state-of-the-art of this dynamic force microscopy technique in 20 chapters, each written by experts in the field. It covers the theoretical basis, as well as applications to semiconducting surfaces, ionic crystals, metal oxides, and organic molecular systems including thin films, polymers, and nucleic acids . . . There are unsolved questions about the mechanisms responsible for atomic resolution but, as this well-written book displays, there has been tremendous progress in basic understanding of the technique and fascinating new applications continue to arise . . . With an increased understanding of NC-AFM, as demonstrated in this book, we are certain to see further progress in the near future."

–Materials Today

Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.

Descrizione libreria

Visita la pagina della libreria

Condizioni di vendita:
Condizioni di spedizione:

Tutti i libri della libreria

Metodi di pagamento
accettati dalla libreria

Visa Mastercard American Express Carte Bleue

Assegno PayPal