Lingua: Inglese
Editore: Springer, 2007
Da: Antiquariat Thomas Haker GmbH & Co. KG, Berlin, Germania
Membro dell'associazione: GIAQ
EUR 24,20
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Wie neu. 778 S., Like new. Shrink wrapped. / Wie neu. In Folie verschweißt. Sprache: Englisch Gewicht in Gramm: 1355 3rd corrected Ed. 2008, corr. 2nd printing 2009.
Da: Studibuch, Stuttgart, Germania
EUR 19,84
Quantità: 1 disponibili
Aggiungi al carrellohardcover. Condizione: Gut. 778 Seiten; 9783540738855.3 Gewicht in Gramm: 2.
Da: Studibuch, Stuttgart, Germania
EUR 19,84
Quantità: 1 disponibili
Aggiungi al carrellohardcover. Condizione: Befriedigend. 778 Seiten; 9783540738855.4 Gewicht in Gramm: 2.
Da: Studibuch, Stuttgart, Germania
EUR 21,93
Quantità: 2 disponibili
Aggiungi al carrellohardcover. Condizione: Befriedigend. 767 Seiten; 9783540678410.4 Gewicht in Gramm: 2.
Da: Studibuch, Stuttgart, Germania
EUR 21,93
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Aggiungi al carrellohardcover. Condizione: Gut. 767 Seiten; 9783540678410.3 Gewicht in Gramm: 2.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 87,99
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Da: Chiron Media, Wallingford, Regno Unito
EUR 88,01
Quantità: 10 disponibili
Aggiungi al carrelloPaperback. Condizione: New.
Lingua: Inglese
Editore: Springer Auflage: 3rd ed. 2008. Corr. 2nd printing 2009, 2008
ISBN 10: 3540738851 ISBN 13: 9783540738855
Da: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, Germania
EUR 99,90
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: gut. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. In englischer Sprache. 758 pages. 3,3 x 16 x 23,3 cm Auflage: 3rd ed. 2008. Corr. 2nd printing 2009.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 123,51
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Da: brandnewtexts4sale, Houston, TX, U.S.A.
Hardcover. Condizione: New. 3rd Edition. 100% BRAND NEW US HARDCOVER STUDENT 3rd Edition / shrink wrapped / Mint condition / ISBN-10: 3540738851 / Shipped out in one business day with free tracking.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 123,16
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 132,63
Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 208,42
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Da: Solr Books, Lincolnwood, IL, U.S.A.
Condizione: very_good. This books is in Very good condition. There may be a few flaws like shelf wear and some light wear.
Lingua: Inglese
Editore: Springer Berlin Heidelberg, 2014
ISBN 10: 3642433154 ISBN 13: 9783642433153
Da: moluna, Greven, Germania
EUR 77,17
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching .
Lingua: Inglese
Editore: Springer Berlin Heidelberg, 2012
ISBN 10: 3642297609 ISBN 13: 9783642297601
Da: moluna, Greven, Germania
EUR 107,09
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching .