Importo totale (1 articolo articoli):
Destinazione ordine:
nadeau dostie benoit (36 risultati)
Vai alla pagina principale dei risultati di ricerca
Filtri di ricerca
Tipo di articolo
- Tutti i tipi di prodotto
- Libri (36)
- Riviste e Giornali (Nessun altro risultato corrispondente a questo perfezionamento)
- Fumetti (Nessun altro risultato corrispondente a questo perfezionamento)
- Spartiti (Nessun altro risultato corrispondente a questo perfezionamento)
- Arte, Stampe e Poster (Nessun altro risultato corrispondente a questo perfezionamento)
- Fotografie (Nessun altro risultato corrispondente a questo perfezionamento)
- Mappe (Nessun altro risultato corrispondente a questo perfezionamento)
- Manoscritti e Collezionismo cartaceo (Nessun altro risultato corrispondente a questo perfezionamento)
Condizioni Maggiori informazioni
- Nuovo (24)
- Come nuovo, Ottimo o Quasi ottimo (4)
- Molto buono o Buono (7)
- Discreto o Mediocre (1)
- Come descritto (Nessun altro risultato corrispondente a questo perfezionamento)
Legatura
Ulteriori caratteristiche
- Prima ed. (Nessun altro risultato corrispondente a questo perfezionamento)
- Copia autograf. (Nessun altro risultato corrispondente a questo perfezionamento)
- Sovracoperta (Nessun altro risultato corrispondente a questo perfezionamento)
- Con foto (11)
- Non Print on Demand (28)
Lingua (2)
Spedizione gratuita
Paese del venditore
Valutazione venditore
-
Design for at-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: Better World Books: West, Reno, NV, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Fine. Used book that is in almost brand-new condition.
-
Design for at-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: Better World Books, Mishawaka, IN, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Good. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages.
-
Hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
-
Design for At-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: ThriftBooks-Dallas, Dallas, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
-
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Libro 37 di 40: Frontiers in Electronic TestingDa: Bay State Book Company, North Smithfield, RI, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: good. The book is in good condition with all pages and cover intact, including the dust jacket if originally issued. The spine may show light wear. Pages may contain some notes or highlighting, and there might be a "From the library of" label. Boxed set packaging, shrink wrap, or included media like CDs may be missing.
-
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Libro 37 di 40: Frontiers in Electronic TestingDa: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.
-
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Libro 37 di 40: Frontiers in Electronic TestingDa: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: acceptable. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear such as cover tears discoloration, staining, marks, scuffs, etc. All pages intact.
-
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Libro 37 di 40: Frontiers in Electronic TestingDa: SatelliteBooks, Burlington, VT, U.S.A.
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: As New. Hardcover, no DJ as issued Free of any markings and no writing. Minor shelf-wear. For Additional Information or pictures, Please Inquire.
-
hardcover. Condizione: Very Good. Pages are crisp and clean, no marking. Cover is verygood. Binding is tight/good.
-
Hardcover. Condizione: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.
-
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Libro 37 di 40: Frontiers in Electronic TestingDa: The Book Spot, Sioux Falls, MN, U.S.A.
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: New.
-
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Libro 37 di 40: Frontiers in Electronic TestingDa: BennettBooksLtd, San Diego, NV, U.S.A.
Valutazione del venditore 5 su 5 stelle
hardcover. Condizione: New. In shrink wrap. Looks like an interesting title!
-
Design For At-speed Test, Diagnosis And Measurement (frontiers In Electronic Testing Volume 15) (frontiers In Electronic Testing)
Libro 37 di 40: Frontiers in Electronic TestingDa: Basi6 International, Irving, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Brand New. New. US edition. Excellent Customer Service.
-
Design For At-speed Test, Diagnosis And Measurement (frontiers In Electronic Testing Volume 15) (frontiers In Electronic Testing)
Libro 37 di 40: Frontiers in Electronic TestingDa: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
-
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Libro 37 di 40: Frontiers in Electronic TestingEUR 122,10
Gratis per la spedizione da Australia a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloBrand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
-
Design for AT-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: Books Puddle, New York, NY, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: New. pp. 260.
-
Design for AT-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: Majestic Books, Hounslow, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 145,42
EUR 7,42 per la spedizione da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: New. pp. 260 Illus.
-
Design for AT-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: Biblios, Frankfurt am main, HESSE, Germania
Valutazione del venditore 4 su 5 stelle
EUR 145,29
EUR 9,95 per la spedizione da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: New. pp. 260.
-
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Libro 37 di 40: Frontiers in Electronic TestingDa: Lucky's Textbooks, Dallas, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 158,55
EUR 3,44 per la spedizione in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
-
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Libro 37 di 40: Frontiers in Electronic TestingDa: Lucky's Textbooks, Dallas, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 158,95
EUR 3,44 per la spedizione in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
-
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Libro 37 di 40: Frontiers in Electronic TestingDa: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 157,74
EUR 13,68 per la spedizione da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
-
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Libro 37 di 40: Frontiers in Electronic TestingDa: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 157,74
EUR 13,68 per la spedizione da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
-
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Libro 37 di 40: Frontiers in Electronic TestingDa: Mispah books, Redhill, SURRE, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 178,76
EUR 28,55 per la spedizione da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Like New. Like New. book.
-
Design for At-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: Books Puddle, New York, NY, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: New. pp. 260.
-
Design for AT-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingEditore: Springer US, Springer New York, 2013
ISBN 10: 1475782918 ISBN 13: 9781475782912
Lingua: Inglese
EUR 164,49
EUR 62,48 per la spedizione da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
-
EUR 168,73
EUR 63,47 per la spedizione da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
-
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Libro 37 di 40: Frontiers in Electronic TestingDa: Mispah books, Redhill, SURRE, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 224,63
EUR 28,55 per la spedizione da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Like New. Like New. book.
-
Design for At-Speed Test, Diagnosis and Measurement-
Editore: Kluwer Academic Publishers-, 2000
Da: "Pursuit of Happiness" Books, Oakland, CA, U.S.A.
Valutazione del venditore 4 su 5 stelle
Hardcover. Condizione: Good. Hardcover/pub.2000/Gd. condition/238 pages- Design-For-Testability (DFT) is explained and demostrated. (H89755). Book.
-
Design for AT-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Valutazione del venditore 5 su 5 stelle
EUR 139,09
EUR 23,00 per la spedizione da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted. 260 pp. Englisch.
-
Design for AT-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Valutazione del venditore 5 su 5 stelle
EUR 160,49
EUR 23,00 per la spedizione da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted. 260 pp. Englisch.
