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Editore: Springer, 2009
ISBN 10: 9048130999ISBN 13: 9789048130993
Da: Jackson Books, Gainsborough, Regno Unito
Libro
Hardcover. Condizione: Good. No Jacket. Text and pages clean and free of markings. Covers with some shelf wear. No dust jacket.
Editore: Springer, 2009
ISBN 10: 9048130999ISBN 13: 9789048130993
Da: booksXpress, Bayonne, NJ, U.S.A.
Libro
Hardcover. Condizione: new.
Editore: Springer, 2012
ISBN 10: 9400736878ISBN 13: 9789400736870
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
Libro
Condizione: New.
Editore: Springer, 2012
ISBN 10: 9400736878ISBN 13: 9789400736870
Da: GreatBookPrices, Columbia, MD, U.S.A.
Libro
Condizione: New.
Editore: Springer, 2009
ISBN 10: 9048130999ISBN 13: 9789048130993
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
Libro
Condizione: New.
Editore: Springer, 2009
ISBN 10: 9048130999ISBN 13: 9789048130993
Da: GreatBookPrices, Columbia, MD, U.S.A.
Libro
Condizione: New.
Editore: SPRINGER NATURE, 2009
ISBN 10: 9048130999ISBN 13: 9789048130993
Da: Buchpark, Trebbin, Germania
Libro
Condizione: Sehr gut. Zustand: Sehr gut - Neubindung, Buchschnitt leicht verkürzt, Auflage 2009 | Seiten: 195 | Sprache: Englisch.
Editore: Springer, 2009
ISBN 10: 9048130999ISBN 13: 9789048130993
Da: GreatBookPricesUK, Castle Donington, DERBY, Regno Unito
Libro
Condizione: New.
Editore: Springer, 2009
ISBN 10: 9048130999ISBN 13: 9789048130993
Da: Books Puddle, New York, NY, U.S.A.
Libro
Condizione: New. pp. 212.
Editore: Springer, 2009
ISBN 10: 9048130999ISBN 13: 9789048130993
Da: GreatBookPrices, Columbia, MD, U.S.A.
Libro
Condizione: As New. Unread book in perfect condition.
Editore: Springer, 2012
ISBN 10: 9400736878ISBN 13: 9789400736870
Da: GreatBookPricesUK, Castle Donington, DERBY, Regno Unito
Libro
Condizione: New.
Editore: Springer Netherlands, 2012
ISBN 10: 9400736878ISBN 13: 9789400736870
Da: moluna, Greven, Germania
Libro Print on Demand
Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents flexible and general techniques for statistical analysis that can be applied to wide variety of circuit applicationsApplies theory from a wide variety of scientific fields (machine learning, computational finance, number theory, actuarial.
Editore: Springer Netherlands, 2009
ISBN 10: 9048130999ISBN 13: 9789048130993
Da: moluna, Greven, Germania
Libro Print on Demand
Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents flexible and general techniques for statistical analysis that can be applied to wide variety of circuit applicationsApplies theory from a wide variety of scientific fields (machine learning, computational finance, number theory, actuarial.
Editore: Springer, 2009
ISBN 10: 9048130999ISBN 13: 9789048130993
Da: Majestic Books, Hounslow, Regno Unito
Libro
Condizione: New. pp. 212 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
Editore: Springer Verlag, 2013
ISBN 10: 9400736878ISBN 13: 9789400736870
Da: Revaluation Books, Exeter, Regno Unito
Libro
Paperback. Condizione: Brand New. 2009 edition. 210 pages. 9.25x6.10x0.48 inches. In Stock.
Editore: Springer, 2012
ISBN 10: 9400736878ISBN 13: 9789400736870
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
Libro
Condizione: New. This book presents novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime. It draws on theories from a wide variety of scientific fields and applies them to parallel problems in numerous other fields. Series: Lecture Notes in Electrical Engineering. Num Pages: 210 pages, biography. BIC Classification: TJFC; UYD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 11. Weight in Grams: 305. . 2012. Paperback. . . . .
Editore: Springer, 2009
ISBN 10: 9048130999ISBN 13: 9789048130993
Da: GreatBookPricesUK, Castle Donington, DERBY, Regno Unito
Libro
Condizione: As New. Unread book in perfect condition.
Editore: Springer, 2009
ISBN 10: 9048130999ISBN 13: 9789048130993
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
Libro
Condizione: New. This book presents novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime. It draws on theories from a wide variety of scientific fields and applies them to parallel problems in numerous other fields. Series: Lecture Notes in Electrical Engineering. Num Pages: 210 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 12. Weight in Grams: 1050. . 2009. Hardback. . . . .
Editore: Springer, 2012
ISBN 10: 1461426723ISBN 13: 9781461426721
Da: booksXpress, Bayonne, NJ, U.S.A.
Libro
Soft Cover. Condizione: new.
Editore: Springer, 2010
ISBN 10: 1441966056ISBN 13: 9781441966056
Da: GreatBookPrices, Columbia, MD, U.S.A.
Libro
Condizione: New.
Editore: Springer US Nov 2012, 2012
ISBN 10: 1461426723ISBN 13: 9781461426721
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Libro Print on Demand
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Knowledge exists: you only have to nd it VLSI design has come to an important in ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri ce too much in terms of power consumption or manufacturing cost, to the extent of making the design goals even infeasible. We absolutely need to explicitly account for the statistics of this random variability, to have design margins that are accurate so that we can nd the optimum balance between yield loss and design cost. This discontinuity in design processes has led many researchers to develop effective methods of statistical design, where the designer can simulate not just the behavior of the nominal design, but the expected statistics of the behavior in manufactured ICs. Memory circuits tend to be the hardest hit by the problem of these random variations because of their high replication count on any single chip, which demands a very high statistical quality from the product. Requirements of 5-6s (0. 256 pp. Englisch.
Editore: Springer, 2012
ISBN 10: 1461426723ISBN 13: 9781461426721
Da: GreatBookPrices, Columbia, MD, U.S.A.
Libro
Condizione: New.
Editore: Springer, 2012
ISBN 10: 1461426723ISBN 13: 9781461426721
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
Libro
Condizione: New.
Editore: Springer, 2012
ISBN 10: 1461426723ISBN 13: 9781461426721
Da: Ria Christie Collections, Uxbridge, Regno Unito
Libro Print on Demand
Condizione: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Editore: Springer, 2012
ISBN 10: 1461426723ISBN 13: 9781461426721
Da: GreatBookPricesUK, Castle Donington, DERBY, Regno Unito
Libro
Condizione: New.
Editore: Springer US, 2012
ISBN 10: 1461426723ISBN 13: 9781461426721
Da: AHA-BUCH GmbH, Einbeck, Germania
Libro
Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Knowledge exists: you only have to nd it VLSI design has come to an important in ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri ce too much in terms of power consumption or manufacturing cost, to the extent of making the design goals even infeasible. We absolutely need to explicitly account for the statistics of this random variability, to have design margins that are accurate so that we can nd the optimum balance between yield loss and design cost. This discontinuity in design processes has led many researchers to develop effective methods of statistical design, where the designer can simulate not just the behavior of the nominal design, but the expected statistics of the behavior in manufactured ICs. Memory circuits tend to be the hardest hit by the problem of these random variations because of their high replication count on any single chip, which demands a very high statistical quality from the product. Requirements of 5-6s (0.
Editore: Springer-Verlag New York Inc., 2012
ISBN 10: 1461426723ISBN 13: 9781461426721
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
Libro Print on Demand
Paperback / softback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
Editore: Springer, 2010
ISBN 10: 1441966056ISBN 13: 9781441966056
Da: GreatBookPricesUK, Castle Donington, DERBY, Regno Unito
Libro
Condizione: New.
Editore: Springer, 2012
ISBN 10: 9400736878ISBN 13: 9789400736870
Da: Kennys Bookstore, Olney, MD, U.S.A.
Libro
Condizione: New. This book presents novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime. It draws on theories from a wide variety of scientific fields and applies them to parallel problems in numerous other fields. Series: Lecture Notes in Electrical Engineering. Num Pages: 210 pages, biography. BIC Classification: TJFC; UYD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 11. Weight in Grams: 305. . 2012. Paperback. . . . . Books ship from the US and Ireland.
Editore: Springer, 2010
ISBN 10: 1441966056ISBN 13: 9781441966056
Da: GreatBookPrices, Columbia, MD, U.S.A.
Libro
Condizione: As New. Unread book in perfect condition.