Importo totale (1 articolo articoli):
Destinazione ordine:
strong alvin (29 risultati)
Vai alla pagina principale dei risultati di ricerca
Filtri di ricerca
Tipo di articolo
- Tutti i tipi di prodotto
- Libri (29)
- Riviste e Giornali (Nessun altro risultato corrispondente a questo perfezionamento)
- Fumetti (Nessun altro risultato corrispondente a questo perfezionamento)
- Spartiti (Nessun altro risultato corrispondente a questo perfezionamento)
- Arte, Stampe e Poster (Nessun altro risultato corrispondente a questo perfezionamento)
- Fotografie (Nessun altro risultato corrispondente a questo perfezionamento)
- Mappe (Nessun altro risultato corrispondente a questo perfezionamento)
- Manoscritti e Collezionismo cartaceo (Nessun altro risultato corrispondente a questo perfezionamento)
Condizioni Maggiori informazioni
- Nuovo (18)
- Come nuovo, Ottimo o Quasi ottimo (5)
- Molto buono o Buono (5)
- Discreto o Mediocre (Nessun altro risultato corrispondente a questo perfezionamento)
- Come descritto (1)
Legatura
Ulteriori caratteristiche
- Prima ed. (2)
- Copia autograf. (Nessun altro risultato corrispondente a questo perfezionamento)
- Sovracoperta (1)
- Con foto (5)
- Non Print on Demand (26)
Lingua (2)
Spedizione gratuita
Paese del venditore
Valutazione venditore
-
Condizione: very_good. Strong, Melodee (illustratore). Book is in very good condition. Clean with little to no signs of wear or markings highlights.
-
Unknown. Condizione: As New. No Jacket. Strong, Melodee (illustratore). Pages are clean and are not marred by notes or folds of any kind. ~ ThriftBooks: Read More, Spend Less.
-
Unknown. Condizione: Very Good. No Jacket. Strong, Melodee (illustratore). Former library book; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
-
Unknown. Condizione: Very Good. No Jacket. Strong, Melodee (illustratore). May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
-
Unknown. Condizione: Very Good. No Jacket. Strong, Melodee (illustratore). May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
-
History of the Canadian Peoples 1867 to the Present
Lingua: Inglese
Editore: Copp Clark Pitman Ltd., Toronto, Ontario, Canada, 1993
ISBN 10: 0773051899 ISBN 13: 9780773051898
Da: Patricia Porter, Kincardine, ON, Canada
Valutazione del venditore 3 su 5 stelle
EUR 22,34
Spedizione EUR 5,20
Spedito da Canada a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloSftCvr, VG, Volume 2, an inclusive survey of Canadian history, 8vo, 631 p, index included.
-
History of the Canadian Peoples, Volume II - 1867 to the Present
Lingua: Inglese
Editore: Copp Clark Pitman, Mississauga, ON, UK, 1993
ISBN 10: 0773051899 ISBN 13: 9780773051898
Da: BookAddiction (IOBA, IBooknet), Canterbury, Regno Unito
Membro dell'associazione: IOBA
Valutazione del venditore 5 su 5 stelle
EUR 26,21
Spedizione EUR 8,10
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloSoftcover. Condizione: Near Fine. Condizione sovraccoperta: N/A. xxii, 632pp; various in-text black and white photographs. Pictorial laminated light card covers. 8vo. Light shelf wear to covers. Internally, neat, clean, bright and tight.
-
History of the Canadian Peoples: Beginnings to 1867 Conrad, Margaret; Finkel, Alvin; Jaenen, Cornelius; Strong-Boag, Ceronica
Da: Aragon Books Canada, OTTAWA, ON, Canada
Valutazione del venditore 3 su 5 stelle
EUR 49,14
Spedizione EUR 19,95
Spedito da Canada a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: New.
-
History of the Canadian Peoples: Beginnings to 1867
Da: Phatpocket Limited, Waltham Abbey, HERTS, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 105,97
Spedizione EUR 12,31
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
-
Reliability Wearout Mechanisms In Advanced Cmos Technologies
Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
-
Condizione: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
-
Condizione: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
-
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Da: Books Puddle, New York, NY, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: New. pp. 624.
-
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Da: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 161,33
Spedizione EUR 2,29
Spedito in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
-
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Da: Majestic Books, Hounslow, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 155,95
Spedizione EUR 7,52
Spedito da Regno Unito a U.S.A.Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. pp. 624.
-
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Da: Biblios, Frankfurt am main, HESSE, Germania
Valutazione del venditore 4 su 5 stelle
EUR 157,31
Spedizione EUR 9,95
Spedito da Germania a U.S.A.Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. pp. 624.
-
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 171,05
Spedizione EUR 7,82
Spedito da Regno Unito a U.S.A.Quantità: 15 disponibili
Aggiungi al carrelloHRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
-
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Da: GreatBookPricesUK, Woodford Green, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 164,62
Spedizione EUR 17,35
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
-
Reliability Wearout Mechanisms in Advanced CMOS Technologies (eng)
Da: Brook Bookstore On Demand, Napoli, NA, Italia
Valutazione del venditore 3 su 5 stelle
EUR 168,46
Spedizione EUR 8,00
Spedito da Italia a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: new.
-
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
Valutazione del venditore 5 su 5 stelle
Prima edizione
EUR 228,03
Spedizione EUR 10,50
Spedito da Irlanda a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. Series: IEEE Press Series on Microelectronic Systems. Num Pages: 624 pages, Illustrations. BIC Classification: TJFC; UY. Category: (P) Professional & Vocational. Dimension: 235 x 162 x 34. Weight in Grams: 982. . 2009. 1st Edition. Hardcover. . . . .
-
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Da: GreatBookPricesUK, Woodford Green, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 237,06
Spedizione EUR 17,35
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
-
Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)
Da: Mispah books, Redhill, SURRE, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 227,54
Spedizione EUR 28,91
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Like New. Like New. book.
-
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Da: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 261,77
Spedizione EUR 2,29
Spedito in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
-
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Da: Revaluation Books, Exeter, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 265,75
Spedizione EUR 14,46
Spedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloHardcover. Condizione: Brand New. 1st edition. 624 pages. 9.50x6.50x1.25 inches. In Stock.
-
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Da: Kennys Bookstore, Olney, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 288,25
Spedizione EUR 9,11
Spedito in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. Series: IEEE Press Series on Microelectronic Systems. Num Pages: 624 pages, Illustrations. BIC Classification: TJFC; UY. Category: (P) Professional & Vocational. Dimension: 235 x 162 x 34. Weight in Grams: 982. . 2009. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.
-
EUR 274,25
Spedizione EUR 65,60
Spedito da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Neuware - A comprehensive treatment of all aspects of CMOS reliability wearout mechanismsThis book covers everything students and professionals need to know about CMOS reliability wearout mechanisms, from basic concepts to the tools necessary to conduct reliability tests and analyze the results. It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent topics, the book covers:\* Introduction to Reliability\* Gate Dielectric Reliability\* Negative Bias Temperature Instability\* Hot Carrier Injection\* Electromigration Reliability\* Stress VoidingChapters conclude with practical appendices that provide very basic experimental procedures for readers who are conducting reliability experiments for the first time. Reliability Wearout Mechanisms in Advanced CMOS Technologies is ideal for students and new engineers who are looking to gain a working understanding of CMOS technology reliability. It is also suitable as a professional reference for experienced circuit design engineers, device design engineers, and process engineers.
-
![Immagine del venditore per Seventeenth Annual Report of the Director of the Bureau of Science 1905 [LeatherBound] venduto da True World of Books](https://pictures.abebooks.com/inventory/md/md31617107859.jpg)
Seventeenth Annual Report of the Director of the Bureau of Science 1905 [LeatherBound]
Data di pubblicazione: 2025
EUR 21,43
Spedizione gratuita
Spedito da India a U.S.A.Quantità: 18 disponibili
Aggiungi al carrelloLeatherBound. Condizione: New. BOOKS ARE EXEMPT FROM IMPORT DUTIES AND TARIFFS; NO EXTRA CHARGES APPLY. LeatherBound edition. Condition: New. Reprinted from 1905 edition. Leather Binding on Spine and Corners with Golden leaf printing on spine. Bound in genuine leather with Satin ribbon page markers and Spine with raised gilt bands. A perfect gift for your loved ones. Pages: 45 NO changes have been made to the original text. This is NOT a retyped or an ocr'd reprint. Illustrations, Index, if any, are included in black and white. Each page is checked manually before printing. As this print on demand book is reprinted from a very old book, there could be some missing or flawed pages, but we always try to make the book as complete as possible. Fold-outs, if any, are not part of the book. If the original book was published in multiple volumes then this reprint is of only one volume, not the whole set. Sewing binding for longer life, where the book block is actually sewn (smythe sewn/section sewn) with thread before binding which results in a more durable type of binding. Pages: 45.
-
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Da: Revaluation Books, Exeter, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 242,95
Spedizione EUR 14,46
Spedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloHardcover. Condizione: Brand New. 1st edition. 624 pages. 9.50x6.50x1.25 inches. In Stock. This item is printed on demand.
-
Reliability Wearout Mechanisms in Advanced CMOS Technologies (Hardcover)
Lingua: Inglese
Editore: John Wiley & Sons Inc, Chicester, 2009
ISBN 10: 0471731722 ISBN 13: 9780471731726
Da: CitiRetail, Stevenage, Regno Unito
Valutazione del venditore 5 su 5 stelle
Prima edizione Print on Demand
EUR 229,91
Spedizione EUR 42,79
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: new. Hardcover. This invaluable resource tells the complete story of failure mechanismsfrom basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections. This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
