Editore: SPIE Optical Engineering Press & JCD Publishing, 1995
ISBN 10: 0964000016 ISBN 13: 9780964000018
Lingua: Inglese
Da: Budget Books, Pasadena, CA, U.S.A.
Hardcover. Condizione: Near Fine. No Jacket. very slight bumps to corners, otherwise new.
Editore: JCD Publishing / SPIE Press, Winter Park, FL / Bellingham, WA, 1998
ISBN 10: 0964000059 ISBN 13: 9780964000056
Lingua: Inglese
Da: Florida Mountain Book Co., Datil, NM, U.S.A.
Condizione: Near Fine. Hardcover, [xvii], 422 pages. Near Fine condition. Second edition. Size 9.25"x6.25". "This revised and expanded edition includes: Automated Testing; Uncertainty Analysis; and System Descriptions. Test methods for: FLIRs; IRST; Machine Vision; and Line Scanners." Book has very light exterior shelfwear, else As New, clean and unmarked.
Editore: JCD Publishing; SPIE Press, 1995
ISBN 10: 0964000016 ISBN 13: 9780964000018
Lingua: Inglese
Da: Riverby Books, Fredericksburg, VA, U.S.A.
Hardcover. Condizione: Good. Hardcover. Black paper over boards with red lettering. Title page not dated. Copyright page dated 1995. 468 pages. Good condition. Shelf wear to covers. Sale sticker on back. Former owner stamp on end pages. Pages clean. Binding stiff. A complete end-to-end system analysis book for scanning systems, staring arrays and line scanners.