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9780306472923 - Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition di Newbury, Dale E.; Kchlin, Patrick; Joy, David C.; Lyman, Charles E.; Lifshin, Eric; Sawyer, L... (18 risultati)
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Hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Hardcover. Condizione: Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority!
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Da: Evergreen Goodwill, Seattle, WA, U.S.A.
Valutazione del venditore 5 su 5 stelle
hardcover. Condizione: Good.
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Da: World of Books (was SecondSale), Montgomery, IL, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Good. Item in good condition. Textbooks may not include supplemental items i.e. CDs, access codes etc.
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Da: The Book Corner, Beaverton, OR, U.S.A.
Valutazione del venditore 5 su 5 stelle
hardcover. Condizione: Very Good. Hardback. No dust jacket. Cover edges and corners in good shape. Cover in good shape with some minimal signs of normal wear. There is a very small sticker on spine at bottom. Spine is a bit loose at top and tight at bottom. Pages are clean, no markings, notes or stains. Includes CD. Ships from Friends bookstore to benefit Beaverton (Oregon) library.
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hardcover. Condizione: Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority!
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Scanning Electron Microscopy and X-Ray Microanalysis
Da: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: good. May show signs of wear, highlighting, writing, and previous use. This item may be a former library book with typical markings. No guarantee on products that contain supplements Your satisfaction is 100% guaranteed. Twenty-five year bookseller with shipments to over fifty million happy customers.
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EUR 63,50
Spedizione EUR 18,36
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy. No dust jacket. Library sticker on front cover. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1750grams, ISBN:9780306472923.
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hardcover. Condizione: New. Ship within 24hrs. 100% Satisfaction is Our #1 Goal!
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Da: Books From California, Simi Valley, CA, U.S.A.
Valutazione del venditore 4 su 5 stelle
hardcover. Condizione: Very Good. Cover and edges may have some wear.
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Scanning Electron Microscopy and X-Ray Microanalysis
Da: GreatBookPricesUK, Woodford Green, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 79,28
Spedizione EUR 17,32
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: good. May show signs of wear, highlighting, writing, and previous use. This item may be a former library book with typical markings. No guarantee on products that contain supplements Your satisfaction is 100% guaranteed. Twenty-five year bookseller with shipments to over fifty million happy customers.
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Da: DeckleEdge LLC, Albuquerque, NM, U.S.A.
Valutazione del venditore 5 su 5 stelle
hardcover. Condizione: new.
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Da: Books Puddle, New York, NY, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: New. pp. xix + 689 3rd Edition.
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Da: Majestic Books, Hounslow, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 139,33
Spedizione EUR 7,50
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: New. pp. xix + 689 232 Illus.
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EUR 125,59
Spedizione EUR 68,51
Spedito da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and 'through-the-lens' detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping.
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Da: Mispah books, Redhill, SURRE, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 185,51
Spedizione EUR 28,86
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Like New. Like New. book.
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Scanning Electron Microscopy and X-Ray Microanalysis
Lingua: Inglese
Editore: Springer Nature Singapore Jan 2003, 2003
ISBN 10: 0306472929 ISBN 13: 9780306472923
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Valutazione del venditore 5 su 5 stelle
EUR 117,69
Spedizione EUR 23,00
Spedito da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed. 689 pp. Englisch.
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Da: Biblios, Frankfurt am main, HESSE, Germania
Valutazione del venditore 4 su 5 stelle
EUR 172,81
Spedizione EUR 9,95
Spedito da Germania a U.S.A.Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND pp. xix + 689.
