Quality and Reliability Engineering (384 risultati)

Condizione: Good. hardcover 100% of proceeds go to charity! Good condition with all pages in tact. Item shows signs of use and may have cosmetic defects.

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Hardcover. Condizione: Very Good. 1. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.

hardcover. Condizione: Very Good.

hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!

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1st edn. Hardback, no d/w (as issued). 313pp. Illustrated red laminated boards with white/blue titles to front and spine. B/w illustrations, charts, tables, figures etc throughout. University donation label to front free endpaper, otherwise FINE.

hardcover. Condizione: Sehr gut. 456 Seiten; 9781119179399.2 Gewicht in Gramm: 1.

Condizione: Very Good.

Hardcover. Condizione: Very Good. 1. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.

Condizione: New.

Hardcover. Condizione: Good. 1st Edition. Ships in a BOX from Central Missouri! May not include working access code. Will not include dust jacket. Has used sticker(s) and some writing or highlighting. UPS shipping for most packages, (Priority Mail for AK/HI/APO/PO Boxes).

Condizione: New.

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Condizione: As New. Unread book in perfect condition.

Hardcover. Condizione: Very Good. 1st Edition. Hardcover, xxxiii+413 pages, NOT ex-library. Gently used, book is clean and bright with unmarked text, free of inscriptions and stamps. Boards show small indentations to edges. Issued without a dust jacket. -- Contents: I Degradation Analysis, Multi- & Continuous-state System Reliability 1 Methods of Solutions of Inhomogeneous Continuous Time Markov Chains for Degradation Process Modeling [Formalism of ICTMC; Numerical Solution Techniques; Examples; Comparisons of the Methods & Guidelines of Utilization] 2 Multistate Degradation & Condition Monitoring for Devices with Multiple Independent Failure Modes [Multistate Degradation & Multiple Independent Failure Modes; Parameter Estimation; Important Reliability Measures of a Condition-Monitored Device; Numerical Example] 3 Time Series Regression with Exponential Errors for Accelerated Testing & Degradation Tracking 4 Inverse Lz-Transform for a Discrete-State Continuous-Time Markov Process & Its Application to Multi-State System Reliability Analysis [Inverse Lz-Transform: Definitions & Computational Procedure; Application of Inverse Lz-Transform to MSS Reliability Analysis; Numerical Example] 5 Lz-Transform Application for Availability Assessment of an Aging Multi-State Water Cooling System for Medical Equipment [Brief Description of Lz-Transform Method; Multi-state Model of the Water Cooling System for the MRI Equipment; Availability Calculation] 6 Combined Clustering & Lz-Transform Technique to Reduce the Computational Complexity of a Multi-State System Reliability Evaluation [Lz-Transform for Dynamic Reliability Evaluation for MSS; Clustering Composition Operator in the Lz-Transform; Computational Procedures; Numerical Example] 7 Sliding Window Systems with Gaps 8 Development of Reliability Measures Motivated by Fuzzy Sets for Systems with Multi- or Infinite-States [Models for Components & Systems Using Fuzzy Sets; Fuzzy Reliability for Systems with Continuous or Infinite States; Dynamic & System Fuzzy Reliability; Examples & Applications] 9 Imperatives for Performability Design in the 21t Century [Strategies for Sustainable Development; Reappraisal of the Performance of Products & Systems; Dependability & Environmental Risk are Interdependent; Performability: Appropriate Measure of Performance; Towards Dependable & Sustainable Designs] / II Networks & Large-Scale Systems 10 Network Reliability Calculations Based on Structural Invariants [1st Invariant: D-Spectrum, Signature; 2nd: Importance Spectrum. Birnbaum Importance Measure BIM; Example: Reliability of a Road Network; 3rd: Border States; Monte Carlo to Approximate the Invariants] 11 Performance & Availability Evaluation of IMS-Based Core Networks 12 Reliability & Probability of First Occurred Failure for Discrete-Time Semi-Markov Systems 13 Single-Source Epidemic Process in a System of Two Interconnected Networks / III Maintenance Models 14 Comparisons of Periodic & Random Replacement Policies 15 Random Evolution of Degradation & Occurrences of Words in Random Sequences of Letters 16 Occupancy Times for Markov & Semi-Markov Models in Systems Reliability 17 Practice of Imperfect Maintenance Model Selection for Diesel Engines 18 Reliability of Warm Standby Systems with Imperfect Fault Coverage / IV Statistical Inference in Reliability 19 Validity of the Weibull-Gnedenko Model 20 Statistical Inference for Heavy-Tailed Distributions in Reliability Systems 21 Robust Inference based on Divergences in Reliability Systems 22 COM-Poisson Cure Rate Models & Associated Likelihood-based Inference with Exponential & Weibull Lifetimes 23 Exponential Expansions for Perturbed Discrete Time Renewal Equations 24 On Generalized Extreme Shock Models under Renewal Shock Processes / V Systemability, Physics-of-failure & Reliability Demonstration 25 Systemability Theory & its Applications 26 Physics-of-Failure based Reliability Engineering 27 Accelerated Testing: Effect of Variance in Field Environmental Conditions on the Demonstrated Reliability.

Condizione: New.

Hardcover. Condizione: new. Hardcover. NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics of failure based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly misapplication of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by demonstrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight into the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardwaresoftware interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability.Challenges existing failure prediction methodologies by highlighting their limitations using real field data.Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems.Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits.Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS.Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process. Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

HRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.