Importo totale (1 articolo articoli):
Destinazione ordine:
Frontiers in Electronic Testing (969 risultati)
Vai alla pagina principale dei risultati di ricerca
Filtri di ricerca
Tipo di articolo
- Tutti i tipi di prodotto
- Libri (969)
- Riviste e Giornali (Nessun altro risultato corrispondente a questo perfezionamento)
- Fumetti (Nessun altro risultato corrispondente a questo perfezionamento)
- Spartiti (Nessun altro risultato corrispondente a questo perfezionamento)
- Arte, Stampe e Poster (Nessun altro risultato corrispondente a questo perfezionamento)
- Fotografie (Nessun altro risultato corrispondente a questo perfezionamento)
- Mappe (Nessun altro risultato corrispondente a questo perfezionamento)
- Manoscritti e Collezionismo cartaceo (Nessun altro risultato corrispondente a questo perfezionamento)
Condizioni Maggiori informazioni
Legatura
Ulteriori caratteristiche
- Prima ed. (2)
- Copia autograf. (1)
- Sovracoperta (Nessun altro risultato corrispondente a questo perfezionamento)
- Con foto (430)
- Non Print on Demand (692)
Lingua (1)
Spedizione gratuita
Paese del venditore
Valutazione venditore
-
Hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
-
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing, 17)
Da: Keeps Books, Wilmington, IL, U.S.A.
Valutazione del venditore 5 su 5 stelle
hardcover. Condizione: Good. Cover has a few edge scuffs and light wear. Used sticker on spine and rear. Text unmarked. Ships Next Business Day.
-
Hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
-
Design for at-Speed Test, Diagnosis and Measurement
Da: Better World Books: West, Reno, NV, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Fine. Used book that is in almost brand-new condition.
-
Design for at-Speed Test, Diagnosis and Measurement
Da: Better World Books, Mishawaka, IN, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Good. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages.
-
Design for At-Speed Test, Diagnosis and Measurement
Da: ThriftBooks-Dallas, Dallas, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less 1.65.
-
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Da: Bay State Book Company, North Smithfield, RI, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: good. The book is in good condition with all pages and cover intact, including the dust jacket if originally issued. The spine may show light wear. Pages may contain some notes or highlighting, and there might be a "From the library of" label. Boxed set packaging, shrink wrap, or included media like CDs may be missing.
-
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Da: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.
-
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Da: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: acceptable. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear such as cover tears discoloration, staining, marks, scuffs, etc. All pages intact.
-
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, 34)
Da: Patrico Books, Apollo Beach, FL, U.S.A.
Valutazione del venditore 5 su 5 stelle
hardcover. Condizione: As New. 2nd. Ships Out Tomorrow!
-
Embedded Processor Based Self Test
Da: Books in my Basket, New Delhi, India
Valutazione del venditore 5 su 5 stelle
EUR 7,75
EUR 16,00 per la spedizione da India a U.S.A.Quantità: 20 disponibili
Aggiungi al carrelloSoft cover. Condizione: New. ISBN:9788184892321,Territorial restriction maybe printed on the book. This is an Int'l edition, ISBN and cover may differ from US edition, Contents same as US edition.
-
Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits
Da: Books in my Basket, New Delhi, India
Valutazione del venditore 5 su 5 stelle
Soft cover. Condizione: New. ISBN:9788184894295,Territorial restriction maybe printed on the book. This is an Int'l edition, ISBN and cover may differ from US edition, Contents same as US edition.
-
Edizione InternazionaleDEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Editore: New Age International Publisher, 2010
ISBN 10: 8184894295 ISBN 13: 9788184894295
Lingua: Inglese
Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
-
Edizione Internazionale
EMBEDDED PROCESSOR BASED SELF TEST
Editore: New Age International Publisher, 2009
ISBN 10: 8184892322 ISBN 13: 9788184892321
Lingua: Inglese
Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
-
DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Editore: New Age International Publisher, 2010
ISBN 10: 8184894295 ISBN 13: 9788184894295
Lingua: Inglese
Condizione: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability.
-
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)
Da: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Good. 150 pp., Hardcover, ex library else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
-
EMBEDDED PROCESSOR BASED SELF TEST
Editore: New Age International Publisher, 2009
ISBN 10: 8184892322 ISBN 13: 9788184892321
Lingua: Inglese
Condizione: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability.
-
Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard
Da: ThriftBooks-Atlanta, AUSTELL, GA, U.S.A.
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less 0.85.
-
Cmos Sram: Circuit Design And Parametric Test In Nano Scaled Technologies Process Aware Sram Design And Test
Da: Books in my Basket, New Delhi, India
Valutazione del venditore 5 su 5 stelle
EUR 12,53
EUR 16,00 per la spedizione da India a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloSoft cover. Condizione: New. ISBN:9788132202325.
-
Hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
-
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Da: SatelliteBooks, Burlington, VT, U.S.A.
Valutazione del venditore 4 su 5 stelle
Hardcover. Condizione: As New. Hardcover, no DJ as issued Free of any markings and no writing. Minor shelf-wear. For Additional Information or pictures, Please Inquire.
-
Fault Diagnosis of Analog Integrated Circuits
Da: Books in my Basket, New Delhi, India
Valutazione del venditore 5 su 5 stelle
EUR 15,07
EUR 16,00 per la spedizione da India a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloSoft cover. Condizione: New. ISBN:9788181288622.
-
Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing) Nicolici, Nicola and Al-Hashimi, Bashir M.
Da: CONTINENTAL MEDIA & BEYOND, Ocala, FL, U.S.A.
Valutazione del venditore 4 su 5 stelle
Hardcover. Condizione: Used: Good. 2003 hardcover no dj as issued xlibrary copy withdrawn stamp on edge of pages/ in book clean text 178 pages::: J-10.
-
Delay Fault Testing for VLSI Circuits
Editore: Kluwer Academic Pub, Boston, 1998
ISBN 10: 0792382951 ISBN 13: 9780792382959
Lingua: Inglese
Da: Feldman's Books, Menlo Park, CA, U.S.A.
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: Very Fine. First Edition. A very clean, unmarked copy.
-
Edizione Internazionale
EMBEDDED PROCESSOR BASED SELF TEST
Da: UK BOOKS STORE, London, LONDO, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 31,19
EUR 4,52 per la spedizione da Regno Unito a U.S.A.Quantità: 19 disponibili
Aggiungi al carrelloPaperback. Condizione: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 7-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
-
Edizione Internazionale
DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Da: UK BOOKS STORE, London, LONDO, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 31,24
EUR 4,52 per la spedizione da Regno Unito a U.S.A.Quantità: 9 disponibili
Aggiungi al carrelloPaperback. Condizione: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 7-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
-
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing, 17)
Da: Textbooks_Source, Columbia, MO, U.S.A.
Valutazione del venditore 5 su 5 stelle
hardcover. Condizione: Good. Corrected 2002. Ships in a BOX from Central Missouri! May not include working access code. Will not include dust jacket. Has used sticker(s) and some writing or highlighting. UPS shipping for most packages, (Priority Mail for AK/HI/APO/PO Boxes).
-
Fault-Tolerance Techniques for SRAM-Based FPGAs
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 32,08
EUR 5,69 per la spedizione da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloHRD. Condizione: Used - Very Good. Used - Like New Book. Shipped from UK. Established seller since 2000.
-
Introduction to Advanced System-on-Chip Test Design and Optimization.
Da: books4less (Versandantiquariat Petra Gros GmbH & Co. KG), Welling, Germania
Valutazione del venditore 5 su 5 stelle
EUR 23,95
EUR 12,95 per la spedizione da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrellogebundene Ausgabe. Condizione: Gut. 388 Seiten; Das hier angebotene Buch stammt aus einer teilaufgelösten wissenschaftlichen Bibliothek und trägt die entsprechenden Kennzeichnungen (Rückenschild, Instituts-Stempel.); Schnitt und Einband sind etwas staubschmutzig; der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. Text in ENGLISCHER Sprache! Sprache: Englisch Gewicht in Gramm: 860.
-
hardcover. Condizione: Very Good. Pages are crisp and clean, no marking. Cover is verygood. Binding is tight/good.
