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Frontiers in Electronic Testing (810 risultati)
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Design for at-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: Better World Books: West, Reno, NV, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Fine. Used book that is in almost brand-new condition. May contain a remainder mark. Better World Books: Buy Books. Do Good.
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Design for at-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: Better World Books, Mishawaka, IN, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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Hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Libro 37 di 40: Frontiers in Electronic TestingDa: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Libro 37 di 40: Frontiers in Electronic TestingDa: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: acceptable. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear such as cover tears discoloration, staining, marks, scuffs, etc. All pages intact.
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Design for at-Speed Test, Diagnosis and Measurement
Libro 37 di 40: Frontiers in Electronic TestingDa: Better World Books Ltd, Dunfermline, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 11,02
Spedizione EUR 5,78
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)
Libro 28 di 40: Frontiers in Electronic TestingDa: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Good. 150 pp., Hardcover, ex library else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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Embedded Processor Based Self Test
Libro 34 di 40: Frontiers in Electronic TestingDa: Books in my Basket, New Delhi, India
Valutazione del venditore 5 su 5 stelle
EUR 7,79
Spedizione EUR 16,00
Spedito da India a U.S.A.Quantità: 20 disponibili
Aggiungi al carrelloSoft cover. Condizione: New. ISBN:9788184892321,Territorial restriction maybe printed on the book. This is an Int'l edition, ISBN and cover may differ from US edition, Contents same as US edition.
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Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits
Libro 18 di 40: Frontiers in Electronic TestingDa: Books in my Basket, New Delhi, India
Valutazione del venditore 5 su 5 stelle
EUR 7,84
Spedizione EUR 16,00
Spedito da India a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloSoft cover. Condizione: New. ISBN:9788184894295,Territorial restriction maybe printed on the book. This is an Int'l edition, ISBN and cover may differ from US edition, Contents same as US edition.
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Edizione InternazionaleDEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Libro 18 di 40: Frontiers in Electronic TestingLingua: Inglese
Editore: New Age International Publisher, 2010
ISBN 10: 8184894295 ISBN 13: 9788184894295
Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
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Edizione Internazionale
EMBEDDED PROCESSOR BASED SELF TEST
Libro 34 di 40: Frontiers in Electronic TestingLingua: Inglese
Editore: New Age International Publisher, 2009
ISBN 10: 8184892322 ISBN 13: 9788184892321
Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
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DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Libro 18 di 40: Frontiers in Electronic TestingLingua: Inglese
Editore: New Age International Publisher, 2010
ISBN 10: 8184894295 ISBN 13: 9788184894295
Condizione: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability.
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EMBEDDED PROCESSOR BASED SELF TEST
Libro 34 di 40: Frontiers in Electronic TestingLingua: Inglese
Editore: New Age International Publisher, 2009
ISBN 10: 8184892322 ISBN 13: 9788184892321
Condizione: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability.
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Hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Cmos Sram: Circuit Design And Parametric Test In Nano Scaled Technologies Process Aware Sram Design And Test
Libro 21 di 40: Frontiers in Electronic TestingDa: Books in my Basket, New Delhi, India
Valutazione del venditore 5 su 5 stelle
EUR 12,59
Spedizione EUR 16,00
Spedito da India a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloSoft cover. Condizione: New. ISBN:9788132202325.
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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing, 17)
Libro 9 di 40: Frontiers in Electronic TestingDa: Goodwill Books, Hillsboro, OR, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: good. Signs of wear and consistent use.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Libro 37 di 40: Frontiers in Electronic TestingDa: SatelliteBooks, Burlington, VT, U.S.A.
Valutazione del venditore 4 su 5 stelle
Hardcover. Condizione: As New. Hardcover, no DJ as issued Free of any markings and no writing. Minor shelf-wear. For Additional Information or pictures, Please Inquire.
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Fault Diagnosis of Analog Integrated Circuits
Libro 5 di 40: Frontiers in Electronic TestingDa: Books in my Basket, New Delhi, India
Valutazione del venditore 5 su 5 stelle
EUR 15,14
Spedizione EUR 16,00
Spedito da India a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloSoft cover. Condizione: New. ISBN:9788181288622.
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Delay Fault Testing for VLSI Circuits
Libro 31 di 40: Frontiers in Electronic TestingLingua: Inglese
Editore: Kluwer Academic Pub, Boston, 1998
ISBN 10: 0792382951 ISBN 13: 9780792382959
Da: Feldman's Books, Menlo Park, CA, U.S.A.
Valutazione del venditore 4 su 5 stelle
Hardcover. Condizione: Very Fine. First Edition. A very clean, unmarked copy.
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Introduction to Advanced System-on-Chip Test Design and Optimization.
Libro 7 di 40: Frontiers in Electronic TestingDa: books4less (Versandantiquariat Petra Gros GmbH & Co. KG), Welling, Germania
Valutazione del venditore 5 su 5 stelle
EUR 23,95
Spedizione EUR 12,95
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrellogebundene Ausgabe. Condizione: Gut. 388 Seiten; Das hier angebotene Buch stammt aus einer teilaufgelösten wissenschaftlichen Bibliothek und trägt die entsprechenden Kennzeichnungen (Rückenschild, Instituts-Stempel.); Schnitt und Einband sind etwas staubschmutzig; der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. Text in ENGLISCHER Sprache! Sprache: Englisch Gewicht in Gramm: 860.
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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing, 17)
Libro 9 di 40: Frontiers in Electronic TestingDa: Textbooks_Source, Columbia, MO, U.S.A.
Valutazione del venditore 5 su 5 stelle
hardcover. Condizione: Good. Corrected 2002. Ships in a BOX from Central Missouri! May not include working access code. Will not include dust jacket. Has used sticker(s) and some writing or highlighting. UPS shipping for most packages, (Priority Mail for AK/HI/APO/PO Boxes).
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hardcover. Condizione: Very Good. Pages are crisp and clean, no marking. Cover is verygood. Binding is tight/good.
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Fault Diagnosis of Analog Integrated Circuits.
Libro 5 di 40: Frontiers in Electronic TestingDa: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germania
Membro dell'associazione: GIAQ ILAB VDA
Valutazione del venditore 4 su 5 stelle
EUR 10,00
Spedizione EUR 30,00
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Frontiers in Electronic Testing, 30. Sprache: Englisch.
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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)
Libro 11 di 40: Frontiers in Electronic TestingDa: CONTINENTAL MEDIA & BEYOND, Ocala, FL, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Used: Good. 2003 hardcover no dj as issued xlibrary copy withdrawn stamp on edge of pages/ in book clean text 178 pages::: J-10.
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Data Mining And Diagnosing Ic Fails
Libro 15 di 40: Frontiers in Electronic TestingDa: Basi6 International, Irving, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Data Mining And Diagnosing Ic Fails
Libro 15 di 40: Frontiers in Electronic TestingDa: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Edizione Internazionale
EMBEDDED PROCESSOR BASED SELF TEST
Libro 34 di 40: Frontiers in Electronic TestingDa: UK BOOKS STORE, London, LONDO, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 34,52
Spedizione EUR 8,08
Spedito da Regno Unito a U.S.A.Quantità: 19 disponibili
Aggiungi al carrelloPaperback. Condizione: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 7-12 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
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Edizione Internazionale
DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Libro 18 di 40: Frontiers in Electronic TestingDa: UK BOOKS STORE, London, LONDO, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 34,57
Spedizione EUR 8,08
Spedito da Regno Unito a U.S.A.Quantità: 9 disponibili
Aggiungi al carrelloPaperback. Condizione: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 7-12 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
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Condizione: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
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Data Mining and Diagnosing IC Fails.
Libro 15 di 40: Frontiers in Electronic TestingLingua: Inglese
Editore: New York/ NY, Springer US., 2005
ISBN 10: 0387249931 ISBN 13: 9780387249933
Da: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germania
Membro dell'associazione: GIAQ ILAB VDA
Valutazione del venditore 4 su 5 stelle
EUR 16,00
Spedizione EUR 30,00
Spedito da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrello2005. 16 x 24 cm. XX, 250 S. XX, 250 p. 46 illus. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. (Frontiers in Electronic Testing). Sprache: Englisch.
