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Editore: Springer, 2012
ISBN 10: 3642273807ISBN 13: 9783642273803
Da: Adkins Books, Chattanooga, TN, U.S.A.
Libro
Hard cover. Condizione: Very good. Free of markings. 2013 ed.
Editore: Springer, 2012
ISBN 10: 3642273807ISBN 13: 9783642273803
Da: Mispah books, Redhill, SURRE, Regno Unito
Libro
Hardcover. Condizione: Like New. Like New. book.
Editore: Springer, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: GF Books, Inc., Hawthorne, CA, U.S.A.
Libro
Condizione: Fine. Book is in Used-LikeNew condition. Pages and cover are clean and intact. Used items may not include supplementary materials such as CDs or access codes. May show signs of minor shelf wear.
Editore: Springer, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: GF Books, Inc., Hawthorne, CA, U.S.A.
Libro
Condizione: New. Book is in NEW condition.
Editore: Springer, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: Book Deals, Tucson, AZ, U.S.A.
Libro
Condizione: New. New! This book is in the same immaculate condition as when it was published.
Editore: Springer, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: booksXpress, Bayonne, NJ, U.S.A.
Libro
Soft Cover. Condizione: new.
Editore: Springer, 2012
ISBN 10: 3642273807ISBN 13: 9783642273803
Da: booksXpress, Bayonne, NJ, U.S.A.
Libro
Hardcover. Condizione: new.
Editore: Springer Berlin Heidelberg, 2012
ISBN 10: 3642273807ISBN 13: 9783642273803
Da: moluna, Greven, Germania
Libro Print on Demand
Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This is the most comprehensive book available on this widely used analytical techniqueThis is the most comprehensive book available on this widely used analytical techniqueIncludes supplementary material: sn.pub/extrasTo anyone who .
Editore: Springer Berlin Heidelberg, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: moluna, Greven, Germania
Libro Print on Demand
Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This is the most comprehensive book available on this widely used analytical techniqueTo anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typica.
Editore: Springer, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: Book Deals, Tucson, AZ, U.S.A.
Libro
Condizione: Fine. Like New condition. Great condition, but not exactly fully crisp. The book may have been opened and read, but there are no defects to the book, jacket or pages.
Editore: Springer, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: Books Unplugged, Amherst, NY, U.S.A.
Libro
Condizione: Good. Buy with confidence! Book is in good condition with minor wear to the pages, binding, and minor marks within.
Editore: Springer, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: Book Deals, Tucson, AZ, U.S.A.
Libro
Condizione: Very Good. Very Good condition. Shows only minor signs of wear, and very minimal markings inside (if any).
Editore: Springer, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: Books Unplugged, Amherst, NY, U.S.A.
Libro
Condizione: Fair. Buy with confidence! Book is in acceptable condition with wear to the pages, binding, and some marks within.
Editore: Springer, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: GF Books, Inc., Hawthorne, CA, U.S.A.
Libro
Condizione: Very Good. Book is in Used-VeryGood condition. Pages and cover are clean and intact. Used items may not include supplementary materials such as CDs or access codes. May show signs of minor shelf wear and contain very limited notes and highlighting.
Editore: Springer, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: Ria Christie Collections, Uxbridge, Regno Unito
Libro Print on Demand
Condizione: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Editore: Springer, 2012
ISBN 10: 3642273807ISBN 13: 9783642273803
Da: Ria Christie Collections, Uxbridge, Regno Unito
Libro Print on Demand
Condizione: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Editore: Springer, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
Libro
Condizione: New.
Editore: Springer, 2012
ISBN 10: 3642273807ISBN 13: 9783642273803
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
Libro
Condizione: New.
Editore: Springer Berlin Heidelberg Okt 2012, 2012
ISBN 10: 3642273807ISBN 13: 9783642273803
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Libro Print on Demand
Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented. 548 pp. Englisch.
Editore: Springer Berlin Heidelberg Nov 2014, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Libro Print on Demand
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented. 548 pp. Englisch.
Editore: Springer Berlin Heidelberg, 2012
ISBN 10: 3642273807ISBN 13: 9783642273803
Da: AHA-BUCH GmbH, Einbeck, Germania
Libro
Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Editore: Springer Berlin Heidelberg, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: AHA-BUCH GmbH, Einbeck, Germania
Libro
Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Editore: Springer, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: Books Puddle, New York, NY, U.S.A.
Libro
Condizione: New.
Editore: Springer, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: California Books, Miami, FL, U.S.A.
Libro
Condizione: New.
Editore: Springer, 2012
ISBN 10: 3642273807ISBN 13: 9783642273803
Da: California Books, Miami, FL, U.S.A.
Libro
Condizione: New.
Editore: Springer Verlag, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: Revaluation Books, Exeter, Regno Unito
Libro
Paperback. Condizione: Brand New. 2013 edition. 550 pages. 9.25x6.10x1.30 inches. In Stock.
Editore: Springer, 2014
ISBN 10: 3642431739ISBN 13: 9783642431739
Da: Majestic Books, Hounslow, Regno Unito
Libro Print on Demand
Condizione: New. Print on Demand.
Editore: Springer Verlag, 2012
ISBN 10: 3642273807ISBN 13: 9783642273803
Da: Revaluation Books, Exeter, Regno Unito
Libro Print on Demand
Hardcover. Condizione: Brand New. 2013 edition. 547 pages. 9.25x6.00x1.00 inches. This item is printed on demand.