Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
EUR 26,11
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Aggiungi al carrelloCondizione: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
Da: Books Puddle, New York, NY, U.S.A.
EUR 23,69
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Aggiungi al carrelloCondizione: New. pp. 202.
Da: SMASS Sellers, IRVING, TX, U.S.A.
EUR 27,27
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Aggiungi al carrelloCondizione: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability.
Da: Books in my Basket, New Delhi, India
EUR 13,67
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Aggiungi al carrelloSoft cover. Condizione: New. ISBN:9788181288653.
Da: Majestic Books, Hounslow, Regno Unito
EUR 21,15
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Aggiungi al carrelloCondizione: New. pp. 202 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
EUR 33,57
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Aggiungi al carrelloCondizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Da: Basi6 International, Irving, TX, U.S.A.
EUR 33,57
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Aggiungi al carrelloCondizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 22,93
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Da: SMASS Sellers, IRVING, TX, U.S.A.
EUR 35,06
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Aggiungi al carrelloCondizione: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
Da: UK BOOKS STORE, London, LONDO, Regno Unito
EUR 43,53
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Aggiungi al carrelloCondizione: Brand New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 7-11 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
Da: ALLBOOKS1, Direk, SA, Australia
EUR 45,94
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Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
EUR 70,04
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Aggiungi al carrelloCondizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Da: Basi6 International, Irving, TX, U.S.A.
EUR 70,04
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Aggiungi al carrelloCondizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Da: ALLBOOKS1, Direk, SA, Australia
EUR 94,07
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Da: GreatBookPrices, Columbia, MD, U.S.A.
EUR 101,61
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Da: Best Price, Torrance, CA, U.S.A.
EUR 96,05
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Da: Best Price, Torrance, CA, U.S.A.
EUR 96,05
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Da: Lucky's Textbooks, Dallas, TX, U.S.A.
EUR 101,86
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Da: Lucky's Textbooks, Dallas, TX, U.S.A.
EUR 102,19
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Da: GreatBookPrices, Columbia, MD, U.S.A.
EUR 120,85
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 116,16
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Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 116,16
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Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 116,15
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Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 126,87
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EUR 118,64
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Aggiungi al carrelloGebunden. Condizione: New. Includes the latest studies/statistics on both verification complexity and design failuresProvides a complete view of the existing specification languages for programmable architecturesDemonstrates the development of functional fault models.
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 109,94
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - It is widely acknowledged that the cost of validation and testing comprises a s- nificant percentage of the overall development costs for electronic systems today, and is expected to escalate sharply in the future. Many studies have shown that up to 70% of the design development time and resources are spent on functional verification. Functional errors manifest themselves very early in the design flow, and unless they are detected up front, they can result in severe consequence- both financially and from a safety viewpoint. Indeed, several recent instances of high-profile functional errors (e. g. , the Pentium FDIV bug) have resulted in - creased attention paid to verifying the functional correctness of designs. Recent efforts have proposed augmenting the traditional RTL simulation-based validation methodology with formal techniques in an attempt to uncover hard-to-find c- ner cases, with the goal of trying to reach RTL functional verification closure. However, what is often not highlighted is the fact that in spite of the tremendous time and effort put into such efforts at the RTL and lower levels of abstraction, the complexity of contemporary embedded systems makes it difficult to guarantee functional correctness at the system level under all possible operational scenarios. The problem is exacerbated in current System-on-Chip (SOC) design meth- ologies that employ Intellectual Property (IP) blocks composed of processor cores, coprocessors, and memory subsystems. Functional verification becomes one of the major bottlenecks in the design of such systems.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 167,77
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Aggiungi al carrelloPaperback. Condizione: Like New. Like New. book.
Da: Buchpark, Trebbin, Germania
Condizione: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 162,93
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Aggiungi al carrelloBuch. Condizione: Neu. Neuware - It is widely acknowledged that the cost of validation and testing comprises a s- nificant percentage of the overall development costs for electronic systems today, and is expected to escalate sharply in the future. Many studies have shown that up to 70% of the design development time and resources are spent on functional verification. Functional errors manifest themselves very early in the design flow, and unless they are detected up front, they can result in severe consequence- both financially and from a safety viewpoint. Indeed, several recent instances of high-profile functional errors (e. g. , the Pentium FDIV bug) have resulted in - creased attention paid to verifying the functional correctness of designs. Recent efforts have proposed augmenting the traditional RTL simulation-based validation methodology with formal techniques in an attempt to uncover hard-to-find c- ner cases, with the goal of trying to reach RTL functional verification closure. However, what is often not highlighted is the fact that in spite of the tremendous time and effort put into such efforts at the RTL and lower levels of abstraction, the complexity of contemporary embedded systems makes it difficult to guarantee functional correctness at the system level under all possible operational scenarios. The problem is exacerbated in current System-on-Chip (SOC) design meth- ologies that employ Intellectual Property (IP) blocks composed of processor cores, coprocessors, and memory subsystems. Functional verification becomes one of the major bottlenecks in the design of such systems.
Editore: Springer, 2005
Da: Books in my Basket, New Delhi, India
EUR 122,69
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Aggiungi al carrelloHardcover. Condizione: New. ISBN:9780387261430.