Ionizing Radiation Effects in Mos Devices and Circuits - Rilegato

Ma, T. P.; Dressendorfer, Paul V.

Rilegato

ISBN 10: 047184893X ISBN 13: 9780471848936

Casa editrice: Wiley-Interscience, 1989

Riassunto

The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.

Su questo libro

L'autore:

T. P. Ma and Paul V. Dressendorfer are the authors of Ionizing Radiation Effects in MOS Devices and Circuits, published by Wiley.

Product Description:

Book by None

Su questa edizione

• Editore: Wiley-Interscience
• Data di pubblicazione: 1989
• ISBN 10: 047184893X
• ISBN 13: 9780471848936
• Rilegatura: Copertina rigida
• Numero di pagine: 608