Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 312,23
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 312,22
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
EUR 333,34
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Da: Phatpocket Limited, Waltham Abbey, HERTS, Regno Unito
EUR 326,31
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
EUR 346,66
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 344,92
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
Prima edizione
EUR 353,13
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. Editor(s): Ma, T. P.; Dressendorfer, Paul V. Num Pages: 608 pages, Ill. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 244 x 168 x 37. Weight in Grams: 1006. . 1989. 1st Edition. hardcover. . . . .
EUR 446,60
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. Editor(s): Ma, T. P.; Dressendorfer, Paul V. Num Pages: 608 pages, Ill. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 244 x 168 x 37. Weight in Grams: 1006. . 1989. 1st Edition. hardcover. . . . . Books ship from the US and Ireland.
Da: Revaluation Books, Exeter, Regno Unito
EUR 454,54
Quantità: 2 disponibili
Aggiungi al carrelloHardcover. Condizione: Brand New. annotated edition. 608 pages. 9.75x6.25x1.00 inches. In Stock.
EUR 422,16
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Neuware - The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
EUR 318,11
Quantità: Più di 20 disponibili
Aggiungi al carrelloHRD. Condizione: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Lingua: Inglese
Editore: John Wiley & Sons Inc, New York, 1989
ISBN 10: 047184893X ISBN 13: 9780471848936
Da: CitiRetail, Stevenage, Regno Unito
Prima edizione Print on Demand
EUR 331,55
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: new. Hardcover. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.