Articoli correlati a Noncontact Atomic Force Microscopy: Volume 2
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.
Contenuti:
Method for Precise Force Measurements.- Force Spectroscopy on Semiconductor Surfaces.- Tip–Sample Interactions as a Function of Distance on Insulating Surfaces.- Force Field Spectroscopy in Three Dimensions.- Principles and Applications of the qPlus Sensor.- Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond.- Atom Manipulation on Semiconductor Surfaces.- Atomic Manipulation on Metal Surfaces.- Atomic Manipulation on an Insulator Surface.- Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM.- Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces.- Magnetic Exchange Force Microscopy.- First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001).- Frequency Modulation Atomic Force Microscopy in Liquids.- Biological Applications of FM-AFM in Liquid Environment.- High-Frequency Low Amplitude Atomic Force Microscopy.- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.
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- EditoreSpringer Nature
- Data di pubblicazione2009
- ISBN 10 3642014941
- ISBN 13 9783642014949
- RilegaturaCopertina rigida
- Numero di pagine401
- RedattoreMorita Seizo, Giessibl Franz J., Wiesendanger Roland
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EUR 228,44
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Descrizione libro Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Most advanced state-of-the-art report on scanning probe microscopyPresents the latest developments in STM and AFMDeals with the various classes of materials studiedA valuable reference work for researchers as well as a study text for. Codice articolo 5043402
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Descrizione libro Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology. 420 pp. Englisch. Codice articolo 9783642014949
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Descrizione libro Condizione: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Codice articolo ria9783642014949_lsuk
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Noncontact Atomic Force Microscopy : Volume 2
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(2009)
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ISBN 13: 9783642014949
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Descrizione libro Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology. Codice articolo 9783642014949
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