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Editore: Springer, 1999
ISBN 10: 0412145618ISBN 13: 9780412145612
Da: Mahler Books, PFLUGERVILLE, TX, U.S.A.
Libro
Hardcover. Condizione: Very Good. This book is in very good condition; no remainder marks. It does have some cover shelfwear. Some scraping inside front cover from removal of a stubborn book plate. Inside pages are clean. ; The Springer International Series In Engineering And Computer Science, 494; 268 pages.
Editore: Springer, 1999
ISBN 10: 0412145618ISBN 13: 9780412145612
Da: More Than Words, Waltham, MA, U.S.A.
Libro
Condizione: Good. . Former Library book. All orders guaranteed and ship within 24 hours. Before placing your order for please contact us for confirmation on the book's binding. Check out our other listings to add to your order for discounted shipping.
Editore: Springer, 1999
ISBN 10: 0412145618ISBN 13: 9780412145612
Da: ThriftBooks-Dallas, Dallas, TX, U.S.A.
Libro
Hardcover. Condizione: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less 1.45.
Editore: Springer, 1999
ISBN 10: 0412145618ISBN 13: 9780412145612
Da: Dream Books Co., Denver, CO, U.S.A.
Libro
Condizione: good. Minimal signs of wear. Corners and cover may show wear. May contain highlighting and or writing. May be missing dust jacket. May not include supplemental materials. May be a former library book.
Editore: Springer, 1999
ISBN 10: 0412145618ISBN 13: 9780412145612
Libro
Hardcover. Condizione: As New. Binding firm, interior clean and unmarked. A nice copy.
Editore: Springer, 1999
ISBN 10: 0412145618ISBN 13: 9780412145612
Da: booksXpress, Bayonne, NJ, U.S.A.
Libro
Hardcover. Condizione: new.
Editore: Springer, 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Da: booksXpress, Bayonne, NJ, U.S.A.
Libro
Soft Cover. Condizione: new.
Editore: Springer, 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
Libro
Condizione: New.
Editore: Springer, 1999
ISBN 10: 0412145618ISBN 13: 9780412145612
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
Libro
Condizione: New.
Editore: Springer, 1999
ISBN 10: 0412145618ISBN 13: 9780412145612
Da: Ria Christie Collections, Uxbridge, Regno Unito
Libro Print on Demand
Condizione: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Editore: Springer, 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Da: Ria Christie Collections, Uxbridge, Regno Unito
Libro Print on Demand
Condizione: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Editore: Springer, 1999
ISBN 10: 0412145618ISBN 13: 9780412145612
Da: GreatBookPrices, Columbia, MD, U.S.A.
Libro
Condizione: New.
Editore: Springer US Nov 2012, 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Libro Print on Demand
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. 272 pp. Englisch.
Editore: Springer US Jan 1999, 1999
ISBN 10: 0412145618ISBN 13: 9780412145612
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Libro Print on Demand
Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. 276 pp. Englisch.
Editore: Springer US, 1999
ISBN 10: 0412145618ISBN 13: 9780412145612
Da: moluna, Greven, Germania
Libro Print on Demand
Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This must have reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical fa.
Editore: Springer US, 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Da: moluna, Greven, Germania
Libro Print on Demand
Kartoniert / Broschiert. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This must have reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical fa.
Editore: Springer US, 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Da: AHA-BUCH GmbH, Einbeck, Germania
Libro
Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.
Editore: Springer US, 1999
ISBN 10: 0412145618ISBN 13: 9780412145612
Da: AHA-BUCH GmbH, Einbeck, Germania
Libro
Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.
Editore: Springer-Verlag New York Inc., 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
Libro
Condizione: New. Editor(s): Wagner, Lawrence C. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 255 pages, biography. BIC Classification: TGM; THR; TJFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 14. Weight in Grams: 421. . 2012. Softcover reprint of the original 1st ed. 1999. Paperback. . . . .
Editore: Chapman and Hall, 1999
ISBN 10: 0412145618ISBN 13: 9780412145612
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
Libro
Condizione: New. Provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. This book also includes the coverage of the shortcomings, limitations, and strengths of each technique. Editor(s): Wagner, Lawrence C. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 255 pages, biography. BIC Classification: TJFC; TJFD5. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 17. Weight in Grams: 565. . 1999. 1999th Edition. hardcover. . . . .
Editore: Springer, 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Da: Mispah books, Redhill, SURRE, Regno Unito
Libro
Paperback. Condizione: Like New. Like New. book.
Editore: Springer, 1999
ISBN 10: 0412145618ISBN 13: 9780412145612
Da: ALLBOOKS1, Salisbury Plain, SA, Australia
Libro
Editore: Springer, 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Da: ALLBOOKS1, Salisbury Plain, SA, Australia
Libro
Editore: Springer, 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Da: GreatBookPrices, Columbia, MD, U.S.A.
Libro
Condizione: As New. Unread book in perfect condition.
Editore: Springer-Verlag New York Inc., 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Da: Kennys Bookstore, Olney, MD, U.S.A.
Libro
Condizione: New. Editor(s): Wagner, Lawrence C. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 255 pages, biography. BIC Classification: TGM; THR; TJFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 14. Weight in Grams: 421. . 2012. Softcover reprint of the original 1st ed. 1999. Paperback. . . . . Books ship from the US and Ireland.
Editore: Chapman and Hall, 1999
ISBN 10: 0412145618ISBN 13: 9780412145612
Da: Kennys Bookstore, Olney, MD, U.S.A.
Libro
Condizione: New. Provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. This book also includes the coverage of the shortcomings, limitations, and strengths of each technique. Editor(s): Wagner, Lawrence C. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 255 pages, biography. BIC Classification: TJFC; TJFD5. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 17. Weight in Grams: 565. . 1999. 1999th Edition. hardcover. . . . . Books ship from the US and Ireland.